Method for enabling comprehensive profiling of garbage-collected memory systems

A method and apparatus for profiling a heap. According to the method, a flexible and comprehensive general-purpose profiling interface that uniformly accommodates a wide variety of memory allocation and garbage collection methods is used. The profiling interface, among other things, employs a set of...

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Hauptverfasser:	Liang, Sheng, Grarup, Steffen
Format:	Patent
Sprache:	eng
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creator	Liang, Sheng Grarup, Steffen
description	A method and apparatus for profiling a heap. According to the method, a flexible and comprehensive general-purpose profiling interface that uniformly accommodates a wide variety of memory allocation and garbage collection methods is used. The profiling interface, among other things, employs a set of virtual machine profiling interface events that support all known types of garbage collection methods.
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title	Method for enabling comprehensive profiling of garbage-collected memory systems
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