RFID tag design with circuitry for wafer level testing

Technologies suitable for on-wafer testing in the ubiquitous computing era are disclosed. Among the inventive features disclosed are: 1) clustering of wafer test probe landing area sites for parallel test sequencing; 2) on wafer test wiring that runs along the wafer's scribe regions; 3) on-wafe...

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Bibliographische Detailangaben

Hauptverfasser:	Glidden, Robert M, Hara, Dennis Kiyoshi, Oliver, Ronald A, Kuhn, Jay A, Hyde, John D
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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