Thin film transistor tester and corresponding test method
To test electrical characteristics of a Thin Film Transistor (TFT) with a source or drain terminal left open and exposed, using a non-contact current source and protecting the TFTs from adverse effects, such as contamination, destruction, and the like. A tester is provided to test a TFT array substr...
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| Format: | Patent |
| Sprache: | eng |
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