Implementation of a fusing scheme to allow internal voltage trimming
Methods and apparatuses for adjusting trim settings for internally generated voltages of an integrated circuit device are provided. In one embodiment the apparatus receives a target digital value for an internally generated voltage, and compares the target digital value to a current digital value fo...
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creator | Huckaby, Jennifer Faye Alexander, George William Baker, Steven Michael Ma, David SuitWai |
description | Methods and apparatuses for adjusting trim settings for internally generated voltages of an integrated circuit device are provided. In one embodiment the apparatus receives a target digital value for an internally generated voltage, and compares the target digital value to a current digital value for the internally generated voltage. If the comparison indicates that a difference between the target digital value and the current digital value is greater than an allowable threshold, a trim setting used to trim the internally generated voltage is adjusted based on the difference. The trim setting may be adjusted until the difference between the target digital value and the current digital value is less than or equal to the allowable threshold. |
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In one embodiment the apparatus receives a target digital value for an internally generated voltage, and compares the target digital value to a current digital value for the internally generated voltage. If the comparison indicates that a difference between the target digital value and the current digital value is greater than an allowable threshold, a trim setting used to trim the internally generated voltage is adjusted based on the difference. The trim setting may be adjusted until the difference between the target digital value and the current digital value is less than or equal to the allowable threshold.</description><language>eng</language><creationdate>2007</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7277350$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,776,798,881,64012</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7277350$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Huckaby, Jennifer Faye</creatorcontrib><creatorcontrib>Alexander, George William</creatorcontrib><creatorcontrib>Baker, Steven Michael</creatorcontrib><creatorcontrib>Ma, David SuitWai</creatorcontrib><creatorcontrib>Infineon Technologies AG</creatorcontrib><title>Implementation of a fusing scheme to allow internal voltage trimming</title><description>Methods and apparatuses for adjusting trim settings for internally generated voltages of an integrated circuit device are provided. In one embodiment the apparatus receives a target digital value for an internally generated voltage, and compares the target digital value to a current digital value for the internally generated voltage. If the comparison indicates that a difference between the target digital value and the current digital value is greater than an allowable threshold, a trim setting used to trim the internally generated voltage is adjusted based on the difference. The trim setting may be adjusted until the difference between the target digital value and the current digital value is less than or equal to the allowable threshold.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2007</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNrjZHDxzC3ISc1NzStJLMnMz1PIT1NIVEgrLc7MS1coTs4AyiiU5Csk5uTklytk5pWkFuUl5iiU5eeUJKYDZYoyc3OBKnkYWNMSc4pTeaE0N4OCm2uIs4duaXFBYgnQ7OL49KJEEGVgbmRubmxqYEyEEgCRbDPs</recordid><startdate>20071002</startdate><enddate>20071002</enddate><creator>Huckaby, Jennifer Faye</creator><creator>Alexander, George William</creator><creator>Baker, Steven Michael</creator><creator>Ma, David SuitWai</creator><scope>EFH</scope></search><sort><creationdate>20071002</creationdate><title>Implementation of a fusing scheme to allow internal voltage trimming</title><author>Huckaby, Jennifer Faye ; Alexander, George William ; Baker, Steven Michael ; Ma, David SuitWai</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_072773503</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2007</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Huckaby, Jennifer Faye</creatorcontrib><creatorcontrib>Alexander, George William</creatorcontrib><creatorcontrib>Baker, Steven Michael</creatorcontrib><creatorcontrib>Ma, David SuitWai</creatorcontrib><creatorcontrib>Infineon Technologies AG</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Huckaby, Jennifer Faye</au><au>Alexander, George William</au><au>Baker, Steven Michael</au><au>Ma, David SuitWai</au><aucorp>Infineon Technologies AG</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Implementation of a fusing scheme to allow internal voltage trimming</title><date>2007-10-02</date><risdate>2007</risdate><abstract>Methods and apparatuses for adjusting trim settings for internally generated voltages of an integrated circuit device are provided. In one embodiment the apparatus receives a target digital value for an internally generated voltage, and compares the target digital value to a current digital value for the internally generated voltage. If the comparison indicates that a difference between the target digital value and the current digital value is greater than an allowable threshold, a trim setting used to trim the internally generated voltage is adjusted based on the difference. The trim setting may be adjusted until the difference between the target digital value and the current digital value is less than or equal to the allowable threshold.</abstract><oa>free_for_read</oa></addata></record> |
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title | Implementation of a fusing scheme to allow internal voltage trimming |
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