Apparatus and method for test-stimuli compaction
Based on the concept of minimization, a method of static compaction has been developed for a digital circuit. The compaction method is a combination of two main procedures: one for the selection of essential test stimuli and the other for the elimination of redundant test stimuli, and effective in m...
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creator | Boateng, Kwame Osei |
description | Based on the concept of minimization, a method of static compaction has been developed for a digital circuit. The compaction method is a combination of two main procedures: one for the selection of essential test stimuli and the other for the elimination of redundant test stimuli, and effective in minimizing any set of test stimuli without modifying any of the test stimuli. |
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fullrecord | <record><control><sourceid>uspatents_EFH</sourceid><recordid>TN_cdi_uspatents_grants_07260793</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>07260793</sourcerecordid><originalsourceid>FETCH-uspatents_grants_072607933</originalsourceid><addsrcrecordid>eNrjZDBwLChILEosKS1WSMxLUchNLcnIT1FIyy9SKEktLtEtLsnMLc3JVEjOzy1ITC7JzM_jYWBNS8wpTuWF0twMCm6uIc4euqXFBYklqXklxfHpRYkgysDcyMzA3NLYmAglAEwTLHY</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Apparatus and method for test-stimuli compaction</title><source>USPTO Issued Patents</source><creator>Boateng, Kwame Osei</creator><creatorcontrib>Boateng, Kwame Osei ; Fujitsu Limited</creatorcontrib><description>Based on the concept of minimization, a method of static compaction has been developed for a digital circuit. The compaction method is a combination of two main procedures: one for the selection of essential test stimuli and the other for the elimination of redundant test stimuli, and effective in minimizing any set of test stimuli without modifying any of the test stimuli.</description><language>eng</language><creationdate>2007</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7260793$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,780,802,885,64039</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7260793$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Boateng, Kwame Osei</creatorcontrib><creatorcontrib>Fujitsu Limited</creatorcontrib><title>Apparatus and method for test-stimuli compaction</title><description>Based on the concept of minimization, a method of static compaction has been developed for a digital circuit. The compaction method is a combination of two main procedures: one for the selection of essential test stimuli and the other for the elimination of redundant test stimuli, and effective in minimizing any set of test stimuli without modifying any of the test stimuli.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2007</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNrjZDBwLChILEosKS1WSMxLUchNLcnIT1FIyy9SKEktLtEtLsnMLc3JVEjOzy1ITC7JzM_jYWBNS8wpTuWF0twMCm6uIc4euqXFBYklqXklxfHpRYkgysDcyMzA3NLYmAglAEwTLHY</recordid><startdate>20070821</startdate><enddate>20070821</enddate><creator>Boateng, Kwame Osei</creator><scope>EFH</scope></search><sort><creationdate>20070821</creationdate><title>Apparatus and method for test-stimuli compaction</title><author>Boateng, Kwame Osei</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_072607933</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2007</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Boateng, Kwame Osei</creatorcontrib><creatorcontrib>Fujitsu Limited</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Boateng, Kwame Osei</au><aucorp>Fujitsu Limited</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Apparatus and method for test-stimuli compaction</title><date>2007-08-21</date><risdate>2007</risdate><abstract>Based on the concept of minimization, a method of static compaction has been developed for a digital circuit. The compaction method is a combination of two main procedures: one for the selection of essential test stimuli and the other for the elimination of redundant test stimuli, and effective in minimizing any set of test stimuli without modifying any of the test stimuli.</abstract><oa>free_for_read</oa></addata></record> |
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title | Apparatus and method for test-stimuli compaction |
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