Method and device for testing at least one LED strip
A test device for at least one LED strip contains: a voltage source, by way of which a cold test voltage or a warm test voltage can be applied to a parallel circuit formed of a test resistor and the LED strip, and an evaluation unit which records the cold test current flowing when a cold test voltag...
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| creator | Klinger, Jürgen |
| description | A test device for at least one LED strip contains: a voltage source, by way of which a cold test voltage or a warm test voltage can be applied to a parallel circuit formed of a test resistor and the LED strip, and an evaluation unit which records the cold test current flowing when a cold test voltage is present and diagnoses an error if the cold test current deviates from a required value by an above-the-threshold amount. A test device contains a switching element connected in series with the test resistor and an error circuit connected to the at least one LED strip, which during the warm testing records an over-the-threshold deviation of a current flowing through the at least one LED strip from a pre-specified value and for an over-the-threshold deviation opens the switching element. |
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A test device contains a switching element connected in series with the test resistor and an error circuit connected to the at least one LED strip, which during the warm testing records an over-the-threshold deviation of a current flowing through the at least one LED strip from a pre-specified value and for an over-the-threshold deviation opens the switching element.</description><language>eng</language><creationdate>2007</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7250872$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,780,802,885,64039</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7250872$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Klinger, Jürgen</creatorcontrib><creatorcontrib>Siemens Aktiengesellschaft</creatorcontrib><title>Method and device for testing at least one LED strip</title><description>A test device for at least one LED strip contains: a voltage source, by way of which a cold test voltage or a warm test voltage can be applied to a parallel circuit formed of a test resistor and the LED strip, and an evaluation unit which records the cold test current flowing when a cold test voltage is present and diagnoses an error if the cold test current deviates from a required value by an above-the-threshold amount. A test device contains a switching element connected in series with the test resistor and an error circuit connected to the at least one LED strip, which during the warm testing records an over-the-threshold deviation of a current flowing through the at least one LED strip from a pre-specified value and for an over-the-threshold deviation opens the switching element.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2007</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNrjZDDxTS3JyE9RSMxLUUhJLctMTlVIyy9SKEktLsnMS1dILFHISU0sLlHIz0tV8HF1USguKcos4GFgTUvMKU7lhdLcDApuriHOHrqlxQWJJal5JcXx6UWJIMrA3MjUwMLcyJgIJQCUySyn</recordid><startdate>20070731</startdate><enddate>20070731</enddate><creator>Klinger, Jürgen</creator><scope>EFH</scope></search><sort><creationdate>20070731</creationdate><title>Method and device for testing at least one LED strip</title><author>Klinger, Jürgen</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_072508723</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2007</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Klinger, Jürgen</creatorcontrib><creatorcontrib>Siemens Aktiengesellschaft</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Klinger, Jürgen</au><aucorp>Siemens Aktiengesellschaft</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method and device for testing at least one LED strip</title><date>2007-07-31</date><risdate>2007</risdate><abstract>A test device for at least one LED strip contains: a voltage source, by way of which a cold test voltage or a warm test voltage can be applied to a parallel circuit formed of a test resistor and the LED strip, and an evaluation unit which records the cold test current flowing when a cold test voltage is present and diagnoses an error if the cold test current deviates from a required value by an above-the-threshold amount. A test device contains a switching element connected in series with the test resistor and an error circuit connected to the at least one LED strip, which during the warm testing records an over-the-threshold deviation of a current flowing through the at least one LED strip from a pre-specified value and for an over-the-threshold deviation opens the switching element.</abstract><oa>free_for_read</oa></addata></record> |
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| title | Method and device for testing at least one LED strip |
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