Method of modeling sanitation levels in food processing equipment

A method of creating a sanitation level model with respect to a predefined microorganism in food processing equipment is provided. The method includes generally three steps. First, a temperature history during a use cycle of the food processing equipment is created. The temperature history includes...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: Stockard, Richard Daniel
Format: Patent
Sprache:eng
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Stockard, Richard Daniel
description A method of creating a sanitation level model with respect to a predefined microorganism in food processing equipment is provided. The method includes generally three steps. First, a temperature history during a use cycle of the food processing equipment is created. The temperature history includes a collection of a plurality of temperatures that the food processing equipment undergoes during the use cycle. The use cycle includes a normal use stage, a sanitizing stage, and perhaps an idle stage. Second, a growth model of the microorganism is continuously applied to each applicable temperature in the temperature history. Third, a death model of the microorganism is continuously applied to each applicable temperature in the temperature history. The created sanitation level model is used to ascertain the microorganism growth/death rate in the food processing equipment during the use cycle.
format Patent
fullrecord <record><control><sourceid>uspatents_EFH</sourceid><recordid>TN_cdi_uspatents_grants_07153470</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>07153470</sourcerecordid><originalsourceid>FETCH-uspatents_grants_071534703</originalsourceid><addsrcrecordid>eNrjZHD0TS3JyE9RyE9TyM1PSc3JzEtXKE7MyyxJLMnMz1PISS1LzSlWyMxTSMsHqiooyk9OLS4GKUotLM0syE3NK-FhYE1LzClO5YXS3AwKbq4hzh66pcUFiSVABcXx6UWJIMrA3NDU2MTcwJgIJQDtvjLq</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method of modeling sanitation levels in food processing equipment</title><source>USPTO Issued Patents</source><creator>Stockard, Richard Daniel</creator><creatorcontrib>Stockard, Richard Daniel ; FMC Technologies, Inc</creatorcontrib><description>A method of creating a sanitation level model with respect to a predefined microorganism in food processing equipment is provided. The method includes generally three steps. First, a temperature history during a use cycle of the food processing equipment is created. The temperature history includes a collection of a plurality of temperatures that the food processing equipment undergoes during the use cycle. The use cycle includes a normal use stage, a sanitizing stage, and perhaps an idle stage. Second, a growth model of the microorganism is continuously applied to each applicable temperature in the temperature history. Third, a death model of the microorganism is continuously applied to each applicable temperature in the temperature history. The created sanitation level model is used to ascertain the microorganism growth/death rate in the food processing equipment during the use cycle.</description><language>eng</language><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7153470$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,780,802,885,64039</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7153470$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Stockard, Richard Daniel</creatorcontrib><creatorcontrib>FMC Technologies, Inc</creatorcontrib><title>Method of modeling sanitation levels in food processing equipment</title><description>A method of creating a sanitation level model with respect to a predefined microorganism in food processing equipment is provided. The method includes generally three steps. First, a temperature history during a use cycle of the food processing equipment is created. The temperature history includes a collection of a plurality of temperatures that the food processing equipment undergoes during the use cycle. The use cycle includes a normal use stage, a sanitizing stage, and perhaps an idle stage. Second, a growth model of the microorganism is continuously applied to each applicable temperature in the temperature history. Third, a death model of the microorganism is continuously applied to each applicable temperature in the temperature history. The created sanitation level model is used to ascertain the microorganism growth/death rate in the food processing equipment during the use cycle.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNrjZHD0TS3JyE9RyE9TyM1PSc3JzEtXKE7MyyxJLMnMz1PISS1LzSlWyMxTSMsHqiooyk9OLS4GKUotLM0syE3NK-FhYE1LzClO5YXS3AwKbq4hzh66pcUFiSVABcXx6UWJIMrA3NDU2MTcwJgIJQDtvjLq</recordid><startdate>20061226</startdate><enddate>20061226</enddate><creator>Stockard, Richard Daniel</creator><scope>EFH</scope></search><sort><creationdate>20061226</creationdate><title>Method of modeling sanitation levels in food processing equipment</title><author>Stockard, Richard Daniel</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_071534703</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2006</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Stockard, Richard Daniel</creatorcontrib><creatorcontrib>FMC Technologies, Inc</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Stockard, Richard Daniel</au><aucorp>FMC Technologies, Inc</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method of modeling sanitation levels in food processing equipment</title><date>2006-12-26</date><risdate>2006</risdate><abstract>A method of creating a sanitation level model with respect to a predefined microorganism in food processing equipment is provided. The method includes generally three steps. First, a temperature history during a use cycle of the food processing equipment is created. The temperature history includes a collection of a plurality of temperatures that the food processing equipment undergoes during the use cycle. The use cycle includes a normal use stage, a sanitizing stage, and perhaps an idle stage. Second, a growth model of the microorganism is continuously applied to each applicable temperature in the temperature history. Third, a death model of the microorganism is continuously applied to each applicable temperature in the temperature history. The created sanitation level model is used to ascertain the microorganism growth/death rate in the food processing equipment during the use cycle.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_uspatents_grants_07153470
source USPTO Issued Patents
title Method of modeling sanitation levels in food processing equipment
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-18T19%3A01%3A20IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFH&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Stockard,%20Richard%20Daniel&rft.aucorp=FMC%20Technologies,%20Inc&rft.date=2006-12-26&rft_id=info:doi/&rft_dat=%3Cuspatents_EFH%3E07153470%3C/uspatents_EFH%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true