Optical position measuring device
An optical position measuring arrangement that includes an incremental measuring graduation and a scanning unit, which can be moved in relation to the incremental measuring graduation along a measuring direction and by which position-dependent incremental signals are generated from scanning the meas...
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| creator | Burgschat, Reiner Böhme, Janos Matz, Manfred |
| description | An optical position measuring arrangement that includes an incremental measuring graduation and a scanning unit, which can be moved in relation to the incremental measuring graduation along a measuring direction and by which position-dependent incremental signals are generated from scanning the measuring graduation. The scanning unit includes a transparent support substrate and two incremental signal scanning arrangements arranged in the measuring direction. Each of the incremental scanning arrangements includes a light source and several incremental signal detector elements, wherein the incremental signal scanning arrangements are arranged on a side of the support substrate facing away from the incremental measuring graduation. The scanning unit includes several fields with scanning gratings, each field is spatially assigned to corresponding incremental signal detector elements and is arranged between the incremental signal scanning arrangements and the support substrate, wherein the scanning gratings are arranged so that partial incremental signals with predetermined phase relations are generated from the incremental signal detector elements. |
| format | Patent |
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The scanning unit includes a transparent support substrate and two incremental signal scanning arrangements arranged in the measuring direction. Each of the incremental scanning arrangements includes a light source and several incremental signal detector elements, wherein the incremental signal scanning arrangements are arranged on a side of the support substrate facing away from the incremental measuring graduation. 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The scanning unit includes several fields with scanning gratings, each field is spatially assigned to corresponding incremental signal detector elements and is arranged between the incremental signal scanning arrangements and the support substrate, wherein the scanning gratings are arranged so that partial incremental signals with predetermined phase relations are generated from the incremental signal detector elements.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNrjZFD0LyjJTE7MUSjIL84syczPU8hNTSwuLcrMS1dISS3LTE7lYWBNS8wpTuWF0twMCm6uIc4euqXFBYklqXklxfHpRYkgysDc0MjY2NTEmAglAH80JsQ</recordid><startdate>20061017</startdate><enddate>20061017</enddate><creator>Burgschat, Reiner</creator><creator>Böhme, Janos</creator><creator>Matz, Manfred</creator><scope>EFH</scope></search><sort><creationdate>20061017</creationdate><title>Optical position measuring device</title><author>Burgschat, Reiner ; Böhme, Janos ; Matz, Manfred</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_071233543</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2006</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Burgschat, Reiner</creatorcontrib><creatorcontrib>Böhme, Janos</creatorcontrib><creatorcontrib>Matz, Manfred</creatorcontrib><creatorcontrib>Dr. Johannes Heidenhain GmbH</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Burgschat, Reiner</au><au>Böhme, Janos</au><au>Matz, Manfred</au><aucorp>Dr. Johannes Heidenhain GmbH</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Optical position measuring device</title><date>2006-10-17</date><risdate>2006</risdate><abstract>An optical position measuring arrangement that includes an incremental measuring graduation and a scanning unit, which can be moved in relation to the incremental measuring graduation along a measuring direction and by which position-dependent incremental signals are generated from scanning the measuring graduation. The scanning unit includes a transparent support substrate and two incremental signal scanning arrangements arranged in the measuring direction. Each of the incremental scanning arrangements includes a light source and several incremental signal detector elements, wherein the incremental signal scanning arrangements are arranged on a side of the support substrate facing away from the incremental measuring graduation. The scanning unit includes several fields with scanning gratings, each field is spatially assigned to corresponding incremental signal detector elements and is arranged between the incremental signal scanning arrangements and the support substrate, wherein the scanning gratings are arranged so that partial incremental signals with predetermined phase relations are generated from the incremental signal detector elements.</abstract><oa>free_for_read</oa></addata></record> |
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| title | Optical position measuring device |
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