Method and apparatus for testing semiconductor devices using an actual board-type product

Semiconductor devices are tested under actual operating conditions by interfacing the devices to an actual board-type product, for example, through a test board tat includes a mounting unit such as a socket or pattern of conductive lands that allows the devices being tested to be mounted to and remo...

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Bibliographische Detailangaben

Hauptverfasser:	Park, Sang-Jun, Kim, Chang-Nyun, Park, Hyun-Ho, Jeong, Nam-Sik, Kim, Jong-Hyun, Yoon, Chung-Koo
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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