Hybrid gap measurement circuit

Systems and methods are disclosed for measuring a distance (or gap) between substrates of a hybrid semiconductor. The measurements may be made during a hybridization process to, for example, provide alignment feedback during the hybridization process. The measurements may also be made after the hybr...

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Hauptverfasser: Parrish, William J, Barton, Jeffrey B, Aziz, Naseem Y, Costello, Adrienne N
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Sprache:eng
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creator Parrish, William J
Barton, Jeffrey B
Aziz, Naseem Y
Costello, Adrienne N
description Systems and methods are disclosed for measuring a distance (or gap) between substrates of a hybrid semiconductor. The measurements may be made during a hybridization process to, for example, provide alignment feedback during the hybridization process. The measurements may also be made after the hybridization process to further calibrate the process or to provide information useful for further processing operations.
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fullrecord <record><control><sourceid>uspatents_EFH</sourceid><recordid>TN_cdi_uspatents_grants_07015715</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>07015715</sourcerecordid><originalsourceid>FETCH-uspatents_grants_070157153</originalsourceid><addsrcrecordid>eNrjZJDzqEwqykxRSE8sUMhNTSwuLUrNTc0rUUjOLEouzSzhYWBNS8wpTuWF0twMCm6uIc4euqXFBYklQIXF8elFiSDKwNzA0NTc0NSYCCUA444leg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Hybrid gap measurement circuit</title><source>USPTO Issued Patents</source><creator>Parrish, William J ; Barton, Jeffrey B ; Aziz, Naseem Y ; Costello, Adrienne N</creator><creatorcontrib>Parrish, William J ; Barton, Jeffrey B ; Aziz, Naseem Y ; Costello, Adrienne N ; Indigo Systems Corporation</creatorcontrib><description>Systems and methods are disclosed for measuring a distance (or gap) between substrates of a hybrid semiconductor. The measurements may be made during a hybridization process to, for example, provide alignment feedback during the hybridization process. The measurements may also be made after the hybridization process to further calibrate the process or to provide information useful for further processing operations.</description><language>eng</language><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7015715$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,776,798,881,64015</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7015715$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Parrish, William J</creatorcontrib><creatorcontrib>Barton, Jeffrey B</creatorcontrib><creatorcontrib>Aziz, Naseem Y</creatorcontrib><creatorcontrib>Costello, Adrienne N</creatorcontrib><creatorcontrib>Indigo Systems Corporation</creatorcontrib><title>Hybrid gap measurement circuit</title><description>Systems and methods are disclosed for measuring a distance (or gap) between substrates of a hybrid semiconductor. The measurements may be made during a hybridization process to, for example, provide alignment feedback during the hybridization process. The measurements may also be made after the hybridization process to further calibrate the process or to provide information useful for further processing operations.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNrjZJDzqEwqykxRSE8sUMhNTSwuLUrNTc0rUUjOLEouzSzhYWBNS8wpTuWF0twMCm6uIc4euqXFBYklQIXF8elFiSDKwNzA0NTc0NSYCCUA444leg</recordid><startdate>20060321</startdate><enddate>20060321</enddate><creator>Parrish, William J</creator><creator>Barton, Jeffrey B</creator><creator>Aziz, Naseem Y</creator><creator>Costello, Adrienne N</creator><scope>EFH</scope></search><sort><creationdate>20060321</creationdate><title>Hybrid gap measurement circuit</title><author>Parrish, William J ; Barton, Jeffrey B ; Aziz, Naseem Y ; Costello, Adrienne N</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_070157153</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2006</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Parrish, William J</creatorcontrib><creatorcontrib>Barton, Jeffrey B</creatorcontrib><creatorcontrib>Aziz, Naseem Y</creatorcontrib><creatorcontrib>Costello, Adrienne N</creatorcontrib><creatorcontrib>Indigo Systems Corporation</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Parrish, William J</au><au>Barton, Jeffrey B</au><au>Aziz, Naseem Y</au><au>Costello, Adrienne N</au><aucorp>Indigo Systems Corporation</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Hybrid gap measurement circuit</title><date>2006-03-21</date><risdate>2006</risdate><abstract>Systems and methods are disclosed for measuring a distance (or gap) between substrates of a hybrid semiconductor. The measurements may be made during a hybridization process to, for example, provide alignment feedback during the hybridization process. The measurements may also be made after the hybridization process to further calibrate the process or to provide information useful for further processing operations.</abstract><oa>free_for_read</oa></addata></record>
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title Hybrid gap measurement circuit
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-24T23%3A10%3A33IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFH&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Parrish,%20William%20J&rft.aucorp=Indigo%20Systems%20Corporation&rft.date=2006-03-21&rft_id=info:doi/&rft_dat=%3Cuspatents_EFH%3E07015715%3C/uspatents_EFH%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true