Diagnosable scan chain

A method and system for locating connector defects in a defective scan chain that has a parallel non-defective scan chain on a different wiring level, with both scan chains being laid out in a regular array pattern. A predetermined bit sequence is scanned into the defective scan chain. The contents...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Eustis, Steven Michael, Pastel, Leah Marie Pfeifer, Bednar, Thomas Richard, Sopchak, Thomas Gregory, Oppold, Jeffery Howard
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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