Circuit and method for monitoring defects

Circuit and method for monitoring defects

A circuit and a method for monitoring defects in an integrated circuit chip. The circuit including a defect monitor portion and a sense element portion, the defect monitor portion either coupled to inputs of sense elements arranged in a chain or coupled between sense elements and forming portions of...

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Hauptverfasser: Bazan, Greg, Cohn, John M, Grady, Matthew S, Nigh, Phillip J, Pastel, Leah M. P, Sopchak, Thomas G
Format: Patent
Sprache:eng
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creator Bazan, Greg
Cohn, John M
Grady, Matthew S
Nigh, Phillip J
Pastel, Leah M. P
Sopchak, Thomas G
description A circuit and a method for monitoring defects in an integrated circuit chip. The circuit including a defect monitor portion and a sense element portion, the defect monitor portion either coupled to inputs of sense elements arranged in a chain or coupled between sense elements and forming portions of the chain.
format Patent
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title Circuit and method for monitoring defects
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