Apertured probes for localized measurements of a material's complex permittivity and fabrication method

A probe for non-destructive determination of complex permittivity of a material and for near field optical microscopy is based on a balanced multi-conductor transmission line structure created on a dielectric substrate member which confines the probing field within a sharply defined sampling volume...

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Bibliographische Detailangaben

Hauptverfasser:	Moreland, Robert L, Christen, Hans M, Talanov, Vladimir V, Schwartz, Andrew R
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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