Multiple local probe measuring device and method

The invention provides a local probe measuring device for effecting local measurements referring to a sample, having a first local probe for local measurements with respect to a sample, a second local probe for local measurements with respect to the sample, a measurement condition adjustment arrange...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Altmann, Stephan Maximilian, Hörber, Johann Karl Heinrich
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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