Low-activation energy silicon-containing resist system

Inventive silsesquioxane polymers are provided, and resist compositions that contain such silsesquioxane polymers are provided in which at least a portion of the silsesquioxane polymer contains fluorinated moieties, and at least a portion of the silisesquioxane polymer contains pendant solubility in...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Huang, Wu-Song, Allen, Robert D, Angelopoulos, Marie, Kwong, Ranee W, Sooriyakumaran, Ratnam
Format: Patent
Sprache:eng
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Huang, Wu-Song
Allen, Robert D
Angelopoulos, Marie
Kwong, Ranee W
Sooriyakumaran, Ratnam
description Inventive silsesquioxane polymers are provided, and resist compositions that contain such silsesquioxane polymers are provided in which at least a portion of the silsesquioxane polymer contains fluorinated moieties, and at least a portion of the silisesquioxane polymer contains pendant solubility inhibiting acid-labile moieties that have low activation energy for acid-catalyzed cleaving, and the presence of high optical density moieties are minimized or avoided. The inventive polymer also contains pendant polar moieties that promote alkaline solubility of the resist in aqueous alkaline solutions. The inventive polymers are particularly useful in positive resist compositions. The invention encompasses methods of using such resist compositions in forming a patterned structure on a substrate, and particularly multilayer (e.g. bilayer) photolithographic methods, which methods are capable of producing high resolution images at wavelengths such as 193 nm and 157 nm.
format Patent
fullrecord <record><control><sourceid>uspatents_EFH</sourceid><recordid>TN_cdi_uspatents_grants_06939664</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>06939664</sourcerecordid><originalsourceid>FETCH-uspatents_grants_069396643</originalsourceid><addsrcrecordid>eNrjZDDzyS_XTUwuySxLLMnMz1NIzUstSq9UKM7MyUzOz9MF4pLEzLzMvHSFotTizOISheLK4pLUXB4G1rTEnOJUXijNzaDg5hri7KFbWlyQWJKaV1Icn16UCKIMzCyNLc3MTIyJUAIAvXovQw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Low-activation energy silicon-containing resist system</title><source>USPTO Issued Patents</source><creator>Huang, Wu-Song ; Allen, Robert D ; Angelopoulos, Marie ; Kwong, Ranee W ; Sooriyakumaran, Ratnam</creator><creatorcontrib>Huang, Wu-Song ; Allen, Robert D ; Angelopoulos, Marie ; Kwong, Ranee W ; Sooriyakumaran, Ratnam ; International Business Machines Corporation</creatorcontrib><description>Inventive silsesquioxane polymers are provided, and resist compositions that contain such silsesquioxane polymers are provided in which at least a portion of the silsesquioxane polymer contains fluorinated moieties, and at least a portion of the silisesquioxane polymer contains pendant solubility inhibiting acid-labile moieties that have low activation energy for acid-catalyzed cleaving, and the presence of high optical density moieties are minimized or avoided. The inventive polymer also contains pendant polar moieties that promote alkaline solubility of the resist in aqueous alkaline solutions. The inventive polymers are particularly useful in positive resist compositions. The invention encompasses methods of using such resist compositions in forming a patterned structure on a substrate, and particularly multilayer (e.g. bilayer) photolithographic methods, which methods are capable of producing high resolution images at wavelengths such as 193 nm and 157 nm.</description><language>eng</language><creationdate>2005</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6939664$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,777,799,882,64018</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6939664$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Huang, Wu-Song</creatorcontrib><creatorcontrib>Allen, Robert D</creatorcontrib><creatorcontrib>Angelopoulos, Marie</creatorcontrib><creatorcontrib>Kwong, Ranee W</creatorcontrib><creatorcontrib>Sooriyakumaran, Ratnam</creatorcontrib><creatorcontrib>International Business Machines Corporation</creatorcontrib><title>Low-activation energy silicon-containing resist system</title><description>Inventive silsesquioxane polymers are provided, and resist compositions that contain such silsesquioxane polymers are provided in which at least a portion of the silsesquioxane polymer contains fluorinated moieties, and at least a portion of the silisesquioxane polymer contains pendant solubility inhibiting acid-labile moieties that have low activation energy for acid-catalyzed cleaving, and the presence of high optical density moieties are minimized or avoided. The inventive polymer also contains pendant polar moieties that promote alkaline solubility of the resist in aqueous alkaline solutions. The inventive polymers are particularly useful in positive resist compositions. The invention encompasses methods of using such resist compositions in forming a patterned structure on a substrate, and particularly multilayer (e.g. bilayer) photolithographic methods, which methods are capable of producing high resolution images at wavelengths such as 193 nm and 157 nm.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2005</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNrjZDDzyS_XTUwuySxLLMnMz1NIzUstSq9UKM7MyUzOz9MF4pLEzLzMvHSFotTizOISheLK4pLUXB4G1rTEnOJUXijNzaDg5hri7KFbWlyQWJKaV1Icn16UCKIMzCyNLc3MTIyJUAIAvXovQw</recordid><startdate>20050906</startdate><enddate>20050906</enddate><creator>Huang, Wu-Song</creator><creator>Allen, Robert D</creator><creator>Angelopoulos, Marie</creator><creator>Kwong, Ranee W</creator><creator>Sooriyakumaran, Ratnam</creator><scope>EFH</scope></search><sort><creationdate>20050906</creationdate><title>Low-activation energy silicon-containing resist system</title><author>Huang, Wu-Song ; Allen, Robert D ; Angelopoulos, Marie ; Kwong, Ranee W ; Sooriyakumaran, Ratnam</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_069396643</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2005</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Huang, Wu-Song</creatorcontrib><creatorcontrib>Allen, Robert D</creatorcontrib><creatorcontrib>Angelopoulos, Marie</creatorcontrib><creatorcontrib>Kwong, Ranee W</creatorcontrib><creatorcontrib>Sooriyakumaran, Ratnam</creatorcontrib><creatorcontrib>International Business Machines Corporation</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Huang, Wu-Song</au><au>Allen, Robert D</au><au>Angelopoulos, Marie</au><au>Kwong, Ranee W</au><au>Sooriyakumaran, Ratnam</au><aucorp>International Business Machines Corporation</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Low-activation energy silicon-containing resist system</title><date>2005-09-06</date><risdate>2005</risdate><abstract>Inventive silsesquioxane polymers are provided, and resist compositions that contain such silsesquioxane polymers are provided in which at least a portion of the silsesquioxane polymer contains fluorinated moieties, and at least a portion of the silisesquioxane polymer contains pendant solubility inhibiting acid-labile moieties that have low activation energy for acid-catalyzed cleaving, and the presence of high optical density moieties are minimized or avoided. The inventive polymer also contains pendant polar moieties that promote alkaline solubility of the resist in aqueous alkaline solutions. The inventive polymers are particularly useful in positive resist compositions. The invention encompasses methods of using such resist compositions in forming a patterned structure on a substrate, and particularly multilayer (e.g. bilayer) photolithographic methods, which methods are capable of producing high resolution images at wavelengths such as 193 nm and 157 nm.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_uspatents_grants_06939664
source USPTO Issued Patents
title Low-activation energy silicon-containing resist system
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-17T20%3A39%3A33IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFH&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Huang,%20Wu-Song&rft.aucorp=International%20Business%20Machines%20Corporation&rft.date=2005-09-06&rft_id=info:doi/&rft_dat=%3Cuspatents_EFH%3E06939664%3C/uspatents_EFH%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true