Gate dielectric and method

CMOS gate dielectric made of high-k metal silicates by passivating a silicon surface with nitrogen compounds prior to high-k dielectric deposition. Optionally, a silicon dioxide monolayer may be preserved at the interface.

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Hauptverfasser: Rotondaro, Antonio L. P, Colombo, Luigi, Bevan, Malcolm J
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Sprache:eng
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creator Rotondaro, Antonio L. P
Colombo, Luigi
Bevan, Malcolm J
description CMOS gate dielectric made of high-k metal silicates by passivating a silicon surface with nitrogen compounds prior to high-k dielectric deposition. Optionally, a silicon dioxide monolayer may be preserved at the interface.
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fullrecord <record><control><sourceid>uspatents_EFH</sourceid><recordid>TN_cdi_uspatents_grants_06919251</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>06919251</sourcerecordid><originalsourceid>FETCH-uspatents_grants_069192513</originalsourceid><addsrcrecordid>eNrjZJByTyxJVUjJTM1JTS4pykxWSMxLUchNLcnIT-FhYE1LzClO5YXS3AwKbq4hzh66pcUFQE15JcXx6UWJIMrAzNLQ0sjU0JgIJQAQ5iOe</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Gate dielectric and method</title><source>USPTO Issued Patents</source><creator>Rotondaro, Antonio L. P ; Colombo, Luigi ; Bevan, Malcolm J</creator><creatorcontrib>Rotondaro, Antonio L. P ; Colombo, Luigi ; Bevan, Malcolm J ; Texas Instruments Incorporated</creatorcontrib><description>CMOS gate dielectric made of high-k metal silicates by passivating a silicon surface with nitrogen compounds prior to high-k dielectric deposition. Optionally, a silicon dioxide monolayer may be preserved at the interface.</description><language>eng</language><creationdate>2005</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6919251$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,776,798,881,64012</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6919251$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Rotondaro, Antonio L. P</creatorcontrib><creatorcontrib>Colombo, Luigi</creatorcontrib><creatorcontrib>Bevan, Malcolm J</creatorcontrib><creatorcontrib>Texas Instruments Incorporated</creatorcontrib><title>Gate dielectric and method</title><description>CMOS gate dielectric made of high-k metal silicates by passivating a silicon surface with nitrogen compounds prior to high-k dielectric deposition. Optionally, a silicon dioxide monolayer may be preserved at the interface.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2005</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNrjZJByTyxJVUjJTM1JTS4pykxWSMxLUchNLcnIT-FhYE1LzClO5YXS3AwKbq4hzh66pcUFQE15JcXx6UWJIMrAzNLQ0sjU0JgIJQAQ5iOe</recordid><startdate>20050719</startdate><enddate>20050719</enddate><creator>Rotondaro, Antonio L. P</creator><creator>Colombo, Luigi</creator><creator>Bevan, Malcolm J</creator><scope>EFH</scope></search><sort><creationdate>20050719</creationdate><title>Gate dielectric and method</title><author>Rotondaro, Antonio L. P ; Colombo, Luigi ; Bevan, Malcolm J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_069192513</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2005</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Rotondaro, Antonio L. P</creatorcontrib><creatorcontrib>Colombo, Luigi</creatorcontrib><creatorcontrib>Bevan, Malcolm J</creatorcontrib><creatorcontrib>Texas Instruments Incorporated</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Rotondaro, Antonio L. P</au><au>Colombo, Luigi</au><au>Bevan, Malcolm J</au><aucorp>Texas Instruments Incorporated</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Gate dielectric and method</title><date>2005-07-19</date><risdate>2005</risdate><abstract>CMOS gate dielectric made of high-k metal silicates by passivating a silicon surface with nitrogen compounds prior to high-k dielectric deposition. Optionally, a silicon dioxide monolayer may be preserved at the interface.</abstract><oa>free_for_read</oa></addata></record>
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title Gate dielectric and method
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-31T06%3A35%3A40IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFH&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Rotondaro,%20Antonio%20L.%20P&rft.aucorp=Texas%20Instruments%20Incorporated&rft.date=2005-07-19&rft_id=info:doi/&rft_dat=%3Cuspatents_EFH%3E06919251%3C/uspatents_EFH%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true