Boundary scan cell for testing AC coupled line using phase modulation technique

An apparatus and a method for testing Alternating Current (AC) coupled interconnects of a circuit using boundary scan methodology are disclosed. A Boundary Scan Cell (BSC) of a transmitting Integrated Circuit (IC) generates an AC signal based on a value of the BSC of the transmitting IC and a refere...

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Bibliographische Detailangaben

Hauptverfasser:	Srinivasaiah, Chandrasekhar Thyamagondlu, Harisharan, Udupi, Ramaswamy, Chidambaram
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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