Arrangement and method for processing electrical substrates using lasers

For processing electric circuit substrates, a laser source with a diode-pumped. quality-controlled, pulsed solid-state laser is used. The laser is able to emit laser radiation with a wavelength between 266 nm and 1064 nm, a pulse repetition rate between 1 kHz and 1 MHz and a pulse length of 30 ns to...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Edme, Sebastien, Lesjak, Stefan, Roelants, Eddy
Format: Patent
Sprache:eng
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Edme, Sebastien
Lesjak, Stefan
Roelants, Eddy
description For processing electric circuit substrates, a laser source with a diode-pumped. quality-controlled, pulsed solid-state laser is used. The laser is able to emit laser radiation with a wavelength between 266 nm and 1064 nm, a pulse repetition rate between 1 kHz and 1 MHz and a pulse length of 30 ns to 200 ns with an average laser power between 1 W and around 5 W. Pre-specified operating modes can be set via a controller, depending on an area of application, with the appropriate different combinations of laser power and repetition rate. Thus, the same laser can optionally be used to perform a drilling operation, an etch removal operation or an exposure operation. Using a galvo mirror deflector unit that can also be controlled via the deflection unit, the laser beam may be deflected on the substrate in accordance with the relevant operating mode.
format Patent
fullrecord <record><control><sourceid>uspatents_EFH</sourceid><recordid>TN_cdi_uspatents_grants_06849823</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>06849823</sourcerecordid><originalsourceid>FETCH-uspatents_grants_068498233</originalsourceid><addsrcrecordid>eNqNjUEKwjAQRbNxIeod5gKCWJG6LKL0AO5lTKexkCZl_uT-BvEArt7iPXhr13eqnILMkow4DTSLvfNAY1ZaNHsBphRIonjTyXMklBdM2QRUvi4yRLF1q5EjZPfjxtH99rj2-4KlxsnwDPVUcTi3p0t7bJo_kg-zzDXx</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Arrangement and method for processing electrical substrates using lasers</title><source>USPTO Issued Patents</source><creator>Edme, Sebastien ; Lesjak, Stefan ; Roelants, Eddy</creator><creatorcontrib>Edme, Sebastien ; Lesjak, Stefan ; Roelants, Eddy ; Siemens Aktiengesellschaft</creatorcontrib><description>For processing electric circuit substrates, a laser source with a diode-pumped. quality-controlled, pulsed solid-state laser is used. The laser is able to emit laser radiation with a wavelength between 266 nm and 1064 nm, a pulse repetition rate between 1 kHz and 1 MHz and a pulse length of 30 ns to 200 ns with an average laser power between 1 W and around 5 W. Pre-specified operating modes can be set via a controller, depending on an area of application, with the appropriate different combinations of laser power and repetition rate. Thus, the same laser can optionally be used to perform a drilling operation, an etch removal operation or an exposure operation. Using a galvo mirror deflector unit that can also be controlled via the deflection unit, the laser beam may be deflected on the substrate in accordance with the relevant operating mode.</description><language>eng</language><creationdate>2005</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6849823$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,776,798,881,64012</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6849823$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Edme, Sebastien</creatorcontrib><creatorcontrib>Lesjak, Stefan</creatorcontrib><creatorcontrib>Roelants, Eddy</creatorcontrib><creatorcontrib>Siemens Aktiengesellschaft</creatorcontrib><title>Arrangement and method for processing electrical substrates using lasers</title><description>For processing electric circuit substrates, a laser source with a diode-pumped. quality-controlled, pulsed solid-state laser is used. The laser is able to emit laser radiation with a wavelength between 266 nm and 1064 nm, a pulse repetition rate between 1 kHz and 1 MHz and a pulse length of 30 ns to 200 ns with an average laser power between 1 W and around 5 W. Pre-specified operating modes can be set via a controller, depending on an area of application, with the appropriate different combinations of laser power and repetition rate. Thus, the same laser can optionally be used to perform a drilling operation, an etch removal operation or an exposure operation. Using a galvo mirror deflector unit that can also be controlled via the deflection unit, the laser beam may be deflected on the substrate in accordance with the relevant operating mode.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2005</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNqNjUEKwjAQRbNxIeod5gKCWJG6LKL0AO5lTKexkCZl_uT-BvEArt7iPXhr13eqnILMkow4DTSLvfNAY1ZaNHsBphRIonjTyXMklBdM2QRUvi4yRLF1q5EjZPfjxtH99rj2-4KlxsnwDPVUcTi3p0t7bJo_kg-zzDXx</recordid><startdate>20050201</startdate><enddate>20050201</enddate><creator>Edme, Sebastien</creator><creator>Lesjak, Stefan</creator><creator>Roelants, Eddy</creator><scope>EFH</scope></search><sort><creationdate>20050201</creationdate><title>Arrangement and method for processing electrical substrates using lasers</title><author>Edme, Sebastien ; Lesjak, Stefan ; Roelants, Eddy</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_068498233</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2005</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Edme, Sebastien</creatorcontrib><creatorcontrib>Lesjak, Stefan</creatorcontrib><creatorcontrib>Roelants, Eddy</creatorcontrib><creatorcontrib>Siemens Aktiengesellschaft</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Edme, Sebastien</au><au>Lesjak, Stefan</au><au>Roelants, Eddy</au><aucorp>Siemens Aktiengesellschaft</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Arrangement and method for processing electrical substrates using lasers</title><date>2005-02-01</date><risdate>2005</risdate><abstract>For processing electric circuit substrates, a laser source with a diode-pumped. quality-controlled, pulsed solid-state laser is used. The laser is able to emit laser radiation with a wavelength between 266 nm and 1064 nm, a pulse repetition rate between 1 kHz and 1 MHz and a pulse length of 30 ns to 200 ns with an average laser power between 1 W and around 5 W. Pre-specified operating modes can be set via a controller, depending on an area of application, with the appropriate different combinations of laser power and repetition rate. Thus, the same laser can optionally be used to perform a drilling operation, an etch removal operation or an exposure operation. Using a galvo mirror deflector unit that can also be controlled via the deflection unit, the laser beam may be deflected on the substrate in accordance with the relevant operating mode.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_uspatents_grants_06849823
source USPTO Issued Patents
title Arrangement and method for processing electrical substrates using lasers
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-04T18%3A26%3A43IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFH&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Edme,%20Sebastien&rft.aucorp=Siemens%20Aktiengesellschaft&rft.date=2005-02-01&rft_id=info:doi/&rft_dat=%3Cuspatents_EFH%3E06849823%3C/uspatents_EFH%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true