Programming of nonvolatile memory cells
The present invention relates generally to electrically erasable, programmable read only memory (EEPROM) cells and specifically, to methods for programming thereto. A method for programming an NROM cell which includes the steps of applying a drain, a source and a gate voltage to the cell and verifyi...
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creator | Bloom, Ilan Eitan, Boaz Cohen, Zeev Finzi, David Maayan, Eduardo |
description | The present invention relates generally to electrically erasable, programmable read only memory (EEPROM) cells and specifically, to methods for programming thereto.
A method for programming an NROM cell which includes the steps of applying a drain, a source and a gate voltage to the cell and verifying a programmed or a non-programmed state of the cell. If the cell is in the non-programmed state, the method includes the steps of increasing the drain voltage and maintaining the gate voltage at a constant level during at least a part of the step of increasing. The steps of applying, verifying, increasing and maintaining are repeated until the cell reaches the programmed state. |
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A method for programming an NROM cell which includes the steps of applying a drain, a source and a gate voltage to the cell and verifying a programmed or a non-programmed state of the cell. If the cell is in the non-programmed state, the method includes the steps of increasing the drain voltage and maintaining the gate voltage at a constant level during at least a part of the step of increasing. The steps of applying, verifying, increasing and maintaining are repeated until the cell reaches the programmed state.</description><language>eng</language><creationdate>2004</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6829172$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,780,802,885,64037</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6829172$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Bloom, Ilan</creatorcontrib><creatorcontrib>Eitan, Boaz</creatorcontrib><creatorcontrib>Cohen, Zeev</creatorcontrib><creatorcontrib>Finzi, David</creatorcontrib><creatorcontrib>Maayan, Eduardo</creatorcontrib><creatorcontrib>Saifun Semiconductors Ltd</creatorcontrib><title>Programming of nonvolatile memory cells</title><description>The present invention relates generally to electrically erasable, programmable read only memory (EEPROM) cells and specifically, to methods for programming thereto.
A method for programming an NROM cell which includes the steps of applying a drain, a source and a gate voltage to the cell and verifying a programmed or a non-programmed state of the cell. If the cell is in the non-programmed state, the method includes the steps of increasing the drain voltage and maintaining the gate voltage at a constant level during at least a part of the step of increasing. The steps of applying, verifying, increasing and maintaining are repeated until the cell reaches the programmed state.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2004</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNrjZFAPKMpPL0rMzc3MS1fIT1PIy88ry89JLMnMSVXITc3NL6pUSE7NySnmYWBNS8wpTuWF0twMCm6uIc4euqXFBYklqXklxfFAY0CUgZmFkaWhuZExEUoAok0pMQ</recordid><startdate>20041207</startdate><enddate>20041207</enddate><creator>Bloom, Ilan</creator><creator>Eitan, Boaz</creator><creator>Cohen, Zeev</creator><creator>Finzi, David</creator><creator>Maayan, Eduardo</creator><scope>EFH</scope></search><sort><creationdate>20041207</creationdate><title>Programming of nonvolatile memory cells</title><author>Bloom, Ilan ; Eitan, Boaz ; Cohen, Zeev ; Finzi, David ; Maayan, Eduardo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_068291723</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2004</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Bloom, Ilan</creatorcontrib><creatorcontrib>Eitan, Boaz</creatorcontrib><creatorcontrib>Cohen, Zeev</creatorcontrib><creatorcontrib>Finzi, David</creatorcontrib><creatorcontrib>Maayan, Eduardo</creatorcontrib><creatorcontrib>Saifun Semiconductors Ltd</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Bloom, Ilan</au><au>Eitan, Boaz</au><au>Cohen, Zeev</au><au>Finzi, David</au><au>Maayan, Eduardo</au><aucorp>Saifun Semiconductors Ltd</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Programming of nonvolatile memory cells</title><date>2004-12-07</date><risdate>2004</risdate><abstract>The present invention relates generally to electrically erasable, programmable read only memory (EEPROM) cells and specifically, to methods for programming thereto.
A method for programming an NROM cell which includes the steps of applying a drain, a source and a gate voltage to the cell and verifying a programmed or a non-programmed state of the cell. If the cell is in the non-programmed state, the method includes the steps of increasing the drain voltage and maintaining the gate voltage at a constant level during at least a part of the step of increasing. The steps of applying, verifying, increasing and maintaining are repeated until the cell reaches the programmed state.</abstract><oa>free_for_read</oa></addata></record> |
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title | Programming of nonvolatile memory cells |
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