Adaptive off tester screening method based on intrinsic die parametric measurements

1. Field of the Invention A method for adaptively providing parametric limits to identify defective die quantizes the die into a plurality of groups according to statistical distributions, such as intrinsic speed in one embodiment. For each quantization level, an intrinsic distribution of the parame...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Rehani, Manu, Cota, Kevin, Abercrombie, David, Madge, Robert
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!