Statistical decision system

This invention relates to the field of testing integrated circuits. More particularly the invention relates to a system for applying the failure limits for various electronic characteristics of an electronic circuit at a point in time after the electronic characteristics of the integrated circuits h...

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Bibliographische Detailangaben

Hauptverfasser:	Madge, Robert J, Sugasawara, Emery, Daasch, W. Robert, McNames, James N, Bockelman, Daniel R, Cota, Kevin
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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