High speed VLSI digital tester architecture for real-time output timing acquisition, results accumulation, and analysis

The present invention relates generally to digital testers, and in particular to automatic test equipment (ATE) used for testing very large system integration (VLSI) digital devices. A tester for testing a digital device. The tester includes a plurality of time measurement units to measure transitio...

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Bibliographische Detailangaben

Hauptverfasser:	Johnson, John C, Nelson, Christopher J, Edenfeld, Donald E
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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