System and method to predetermine a bitmap of a self-tested embedded array

1. Field of the Invention A built-in self-test (BIST) system and method for testing an array of embedded electronic devices, the BIST comprising: a shift register device connected to an output pin of an embedded array of electronic devices being tested and for receiving a failure indication signal a...

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Bibliographische Detailangaben
Hauptverfasser:	Gangl, David V, Grady, Matthew Sean, Iverson, David John, Maier, Gary William, Shearer, Robert Edward, Wheater, Donald Lawrence
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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