Semiconductor device having improved contact hole structure, and method of manufacturing the same

1. Field of the Invention Within an interlayer dielectric film laid on a semiconductor substrate, a first conducting line is formed at a position lower than a second conducting line. Further, an etching stopper film, which has an etch selectivity differing from that of the interlayer dielectric film...

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Bibliographische Detailangaben
1. Verfasser: Sakamori, Shigenori
Format: Patent
Sprache:eng
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