Spectroplarimetric reflectometer

The invention described herein may be manufactured and used by or for the Government of the United States for all governmental purposes without the payment of any royalty. A spectropolarimetric reflectometer for measuring polarimetric reflection properties of materials over broad spectral wavelength...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Goldstein, Dennis H, Chenault, David B, Owens, Monte
Format: Patent
Sprache:eng
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