Microelectronic fabrication having microelectronic capacitor structure fabricated therein
1. Field of the Invention Within a method for fabricating a microelectronic fabrication, and the microelectronic fabrication fabricated employing the method, there is formed within the microelectronic fabrication a capacitor structure upon a conductor stud layer formed into a first via defined by a...
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creator | Huang, Chi-Feng Chen, Chun-Hon |
description | 1. Field of the Invention
Within a method for fabricating a microelectronic fabrication, and the microelectronic fabrication fabricated employing the method, there is formed within the microelectronic fabrication a capacitor structure upon a conductor stud layer formed into a first via defined by a patterned dielectric layer to reach a one of a pair of patterned conductor layers within the microelectronic fabrication prior to forming through the patterned dielectric layer a second via to reach the other of the pair of patterned conductor layers within the microelectronic fabrication. The method provides the resulting microelectronic fabrication with enhanced reliability and performance. |
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Within a method for fabricating a microelectronic fabrication, and the microelectronic fabrication fabricated employing the method, there is formed within the microelectronic fabrication a capacitor structure upon a conductor stud layer formed into a first via defined by a patterned dielectric layer to reach a one of a pair of patterned conductor layers within the microelectronic fabrication prior to forming through the patterned dielectric layer a second via to reach the other of the pair of patterned conductor layers within the microelectronic fabrication. The method provides the resulting microelectronic fabrication with enhanced reliability and performance.</description><language>eng</language><creationdate>2003</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6583491$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,776,798,881,64012</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6583491$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Huang, Chi-Feng</creatorcontrib><creatorcontrib>Chen, Chun-Hon</creatorcontrib><creatorcontrib>Taiwan Semiconductor Manufacturing Co., Ltd</creatorcontrib><title>Microelectronic fabrication having microelectronic capacitor structure fabricated therein</title><description>1. Field of the Invention
Within a method for fabricating a microelectronic fabrication, and the microelectronic fabrication fabricated employing the method, there is formed within the microelectronic fabrication a capacitor structure upon a conductor stud layer formed into a first via defined by a patterned dielectric layer to reach a one of a pair of patterned conductor layers within the microelectronic fabrication prior to forming through the patterned dielectric layer a second via to reach the other of the pair of patterned conductor layers within the microelectronic fabrication. The method provides the resulting microelectronic fabrication with enhanced reliability and performance.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2003</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNrjZIj0zUwuyk_NSU0uKcrPy0xWSEtMKspMTizJzM9TyEgsy8xLV8hFU5KcWJCYnFmSX6RQXFJUmlxSWpQK15aaolCSkVqUmpnHw8CalphTnMoLpbkZFNxcQ5w9dEuLC4Dq8kqK49OLEkGUgZmphbGJpaExEUoAXiU9FA</recordid><startdate>20030624</startdate><enddate>20030624</enddate><creator>Huang, Chi-Feng</creator><creator>Chen, Chun-Hon</creator><scope>EFH</scope></search><sort><creationdate>20030624</creationdate><title>Microelectronic fabrication having microelectronic capacitor structure fabricated therein</title><author>Huang, Chi-Feng ; Chen, Chun-Hon</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_065834913</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2003</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Huang, Chi-Feng</creatorcontrib><creatorcontrib>Chen, Chun-Hon</creatorcontrib><creatorcontrib>Taiwan Semiconductor Manufacturing Co., Ltd</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Huang, Chi-Feng</au><au>Chen, Chun-Hon</au><aucorp>Taiwan Semiconductor Manufacturing Co., Ltd</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Microelectronic fabrication having microelectronic capacitor structure fabricated therein</title><date>2003-06-24</date><risdate>2003</risdate><abstract>1. Field of the Invention
Within a method for fabricating a microelectronic fabrication, and the microelectronic fabrication fabricated employing the method, there is formed within the microelectronic fabrication a capacitor structure upon a conductor stud layer formed into a first via defined by a patterned dielectric layer to reach a one of a pair of patterned conductor layers within the microelectronic fabrication prior to forming through the patterned dielectric layer a second via to reach the other of the pair of patterned conductor layers within the microelectronic fabrication. The method provides the resulting microelectronic fabrication with enhanced reliability and performance.</abstract><oa>free_for_read</oa></addata></record> |
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title | Microelectronic fabrication having microelectronic capacitor structure fabricated therein |
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