Pupil filtering for a lithographic tool

The present invention relates generally to integrated circuit fabrication equipment. More particularly, the present invention relates to integrated circuit fabrication system for and a method of correcting pupil errors. Even further, the present invention relates to a mask that includes a layer for...

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Hauptverfasser: Kye, Jongwook, La Fontaine, Bruno M
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Sprache:eng
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creator Kye, Jongwook
La Fontaine, Bruno M
description The present invention relates generally to integrated circuit fabrication equipment. More particularly, the present invention relates to integrated circuit fabrication system for and a method of correcting pupil errors. Even further, the present invention relates to a mask that includes a layer for pupil filtering in a photolithographic camera or stepper unit. A mask or reticle is optimized for use in a lithographic system. The mask or reticle includes a substrate and a pupil filter pattern. The substrate includes an IC pattern representing at least one integrated circuit feature. The pupil filter pattern can enhance the resolution associated with the lithographic system.
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fullrecord <record><control><sourceid>uspatents_EFH</sourceid><recordid>TN_cdi_uspatents_grants_06555274</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>06555274</sourcerecordid><originalsourceid>FETCH-uspatents_grants_065552743</originalsourceid><addsrcrecordid>eNrjZFAPKC3IzFFIy8wpSS3KzEtXSMsvUkhUyMksychPL0osyMhMVijJz8_hYWBNS8wpTuWF0twMCm6uIc4euqXFBYklqXklxfFA5SDKwMzU1NTI3MSYCCUAeY4o0g</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Pupil filtering for a lithographic tool</title><source>USPTO Issued Patents</source><creator>Kye, Jongwook ; La Fontaine, Bruno M</creator><creatorcontrib>Kye, Jongwook ; La Fontaine, Bruno M</creatorcontrib><description>The present invention relates generally to integrated circuit fabrication equipment. More particularly, the present invention relates to integrated circuit fabrication system for and a method of correcting pupil errors. Even further, the present invention relates to a mask that includes a layer for pupil filtering in a photolithographic camera or stepper unit. A mask or reticle is optimized for use in a lithographic system. The mask or reticle includes a substrate and a pupil filter pattern. The substrate includes an IC pattern representing at least one integrated circuit feature. The pupil filter pattern can enhance the resolution associated with the lithographic system.</description><language>eng</language><creationdate>2003</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6555274$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,780,802,885,64039</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6555274$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Kye, Jongwook</creatorcontrib><creatorcontrib>La Fontaine, Bruno M</creatorcontrib><title>Pupil filtering for a lithographic tool</title><description>The present invention relates generally to integrated circuit fabrication equipment. More particularly, the present invention relates to integrated circuit fabrication system for and a method of correcting pupil errors. Even further, the present invention relates to a mask that includes a layer for pupil filtering in a photolithographic camera or stepper unit. A mask or reticle is optimized for use in a lithographic system. The mask or reticle includes a substrate and a pupil filter pattern. The substrate includes an IC pattern representing at least one integrated circuit feature. The pupil filter pattern can enhance the resolution associated with the lithographic system.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2003</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNrjZFAPKC3IzFFIy8wpSS3KzEtXSMsvUkhUyMksychPL0osyMhMVijJz8_hYWBNS8wpTuWF0twMCm6uIc4euqXFBYklqXklxfFA5SDKwMzU1NTI3MSYCCUAeY4o0g</recordid><startdate>20030429</startdate><enddate>20030429</enddate><creator>Kye, Jongwook</creator><creator>La Fontaine, Bruno M</creator><scope>EFH</scope></search><sort><creationdate>20030429</creationdate><title>Pupil filtering for a lithographic tool</title><author>Kye, Jongwook ; La Fontaine, Bruno M</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_065552743</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2003</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Kye, Jongwook</creatorcontrib><creatorcontrib>La Fontaine, Bruno M</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kye, Jongwook</au><au>La Fontaine, Bruno M</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Pupil filtering for a lithographic tool</title><date>2003-04-29</date><risdate>2003</risdate><abstract>The present invention relates generally to integrated circuit fabrication equipment. More particularly, the present invention relates to integrated circuit fabrication system for and a method of correcting pupil errors. Even further, the present invention relates to a mask that includes a layer for pupil filtering in a photolithographic camera or stepper unit. A mask or reticle is optimized for use in a lithographic system. The mask or reticle includes a substrate and a pupil filter pattern. The substrate includes an IC pattern representing at least one integrated circuit feature. The pupil filter pattern can enhance the resolution associated with the lithographic system.</abstract><oa>free_for_read</oa></addata></record>
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title Pupil filtering for a lithographic tool
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T22%3A36%3A26IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFH&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Kye,%20Jongwook&rft.date=2003-04-29&rft_id=info:doi/&rft_dat=%3Cuspatents_EFH%3E06555274%3C/uspatents_EFH%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true