Process for continuous determination of the optical layer thickness of coatings

Process for continuous determination of the optical layer thickness of coatings

The invention relates to a process for continuous determination of the optical layer thickness of coatings, which are applied on both sides of the spherical surfaces of concave convex lenses having different spherical radii R and R . Process for continuous determination of the optical layer thicknes...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Dieter, Torsten, Beckman, Rudolf, Zoller, Alfons, Hagedorn, Harro
Format: Patent
Sprache:eng
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Dieter, Torsten
Beckman, Rudolf
Zoller, Alfons
Hagedorn, Harro
description The invention relates to a process for continuous determination of the optical layer thickness of coatings, which are applied on both sides of the spherical surfaces of concave convex lenses having different spherical radii R and R . Process for continuous determination of the optical layer thickness of coatings, which are applied on both sides of the spherical surfaces of concave convex lenses having different spherical radii Rand R. In this process a ray of light is beamed eccentrically during the coating process at each concave convex lens, and the reflection or transmission at the convex spherical surface and at the concave spherical surface is continuously measured with photodiodes, and the respective optical layer thickness is determined from the functional relationship between the reflection or the transmission and the optical layer thickness.
format Patent
fullrecord <record><control><sourceid>uspatents_EFH</sourceid><recordid>TN_cdi_uspatents_grants_06549291</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>06549291</sourcerecordid><originalsourceid>FETCH-uspatents_grants_065492913</originalsourceid><addsrcrecordid>eNqNiz0KAjEQRtNYiHqHucCC_7C1rNhpYS9DnKxh48ySmRTe3ix4AKsH73vf3F1vWTypQpAMXtgiFykKTzLK78hoURgkgL0IZLToMUHCD-Vqoh94-tbZSy2516WbBUxKqx8XDs7d_XRpio5oxKaPPuOE9fGwb7ftZvdH8gVmlDh0</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Process for continuous determination of the optical layer thickness of coatings</title><source>USPTO Issued Patents</source><creator>Dieter, Torsten ; Beckman, Rudolf ; Zoller, Alfons ; Hagedorn, Harro</creator><creatorcontrib>Dieter, Torsten ; Beckman, Rudolf ; Zoller, Alfons ; Hagedorn, Harro ; Balzers Leybold Optics GmbH</creatorcontrib><description>The invention relates to a process for continuous determination of the optical layer thickness of coatings, which are applied on both sides of the spherical surfaces of concave convex lenses having different spherical radii R and R . Process for continuous determination of the optical layer thickness of coatings, which are applied on both sides of the spherical surfaces of concave convex lenses having different spherical radii Rand R. In this process a ray of light is beamed eccentrically during the coating process at each concave convex lens, and the reflection or transmission at the convex spherical surface and at the concave spherical surface is continuously measured with photodiodes, and the respective optical layer thickness is determined from the functional relationship between the reflection or the transmission and the optical layer thickness.</description><language>eng</language><creationdate>2003</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6549291$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,776,798,881,64015</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6549291$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Dieter, Torsten</creatorcontrib><creatorcontrib>Beckman, Rudolf</creatorcontrib><creatorcontrib>Zoller, Alfons</creatorcontrib><creatorcontrib>Hagedorn, Harro</creatorcontrib><creatorcontrib>Balzers Leybold Optics GmbH</creatorcontrib><title>Process for continuous determination of the optical layer thickness of coatings</title><description>The invention relates to a process for continuous determination of the optical layer thickness of coatings, which are applied on both sides of the spherical surfaces of concave convex lenses having different spherical radii R and R . Process for continuous determination of the optical layer thickness of coatings, which are applied on both sides of the spherical surfaces of concave convex lenses having different spherical radii Rand R. In this process a ray of light is beamed eccentrically during the coating process at each concave convex lens, and the reflection or transmission at the convex spherical surface and at the concave spherical surface is continuously measured with photodiodes, and the respective optical layer thickness is determined from the functional relationship between the reflection or the transmission and the optical layer thickness.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2003</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNqNiz0KAjEQRtNYiHqHucCC_7C1rNhpYS9DnKxh48ySmRTe3ix4AKsH73vf3F1vWTypQpAMXtgiFykKTzLK78hoURgkgL0IZLToMUHCD-Vqoh94-tbZSy2516WbBUxKqx8XDs7d_XRpio5oxKaPPuOE9fGwb7ftZvdH8gVmlDh0</recordid><startdate>20030415</startdate><enddate>20030415</enddate><creator>Dieter, Torsten</creator><creator>Beckman, Rudolf</creator><creator>Zoller, Alfons</creator><creator>Hagedorn, Harro</creator><scope>EFH</scope></search><sort><creationdate>20030415</creationdate><title>Process for continuous determination of the optical layer thickness of coatings</title><author>Dieter, Torsten ; Beckman, Rudolf ; Zoller, Alfons ; Hagedorn, Harro</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_065492913</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2003</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Dieter, Torsten</creatorcontrib><creatorcontrib>Beckman, Rudolf</creatorcontrib><creatorcontrib>Zoller, Alfons</creatorcontrib><creatorcontrib>Hagedorn, Harro</creatorcontrib><creatorcontrib>Balzers Leybold Optics GmbH</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Dieter, Torsten</au><au>Beckman, Rudolf</au><au>Zoller, Alfons</au><au>Hagedorn, Harro</au><aucorp>Balzers Leybold Optics GmbH</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Process for continuous determination of the optical layer thickness of coatings</title><date>2003-04-15</date><risdate>2003</risdate><abstract>The invention relates to a process for continuous determination of the optical layer thickness of coatings, which are applied on both sides of the spherical surfaces of concave convex lenses having different spherical radii R and R . Process for continuous determination of the optical layer thickness of coatings, which are applied on both sides of the spherical surfaces of concave convex lenses having different spherical radii Rand R. In this process a ray of light is beamed eccentrically during the coating process at each concave convex lens, and the reflection or transmission at the convex spherical surface and at the concave spherical surface is continuously measured with photodiodes, and the respective optical layer thickness is determined from the functional relationship between the reflection or the transmission and the optical layer thickness.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_uspatents_grants_06549291
source USPTO Issued Patents
title Process for continuous determination of the optical layer thickness of coatings
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-24T04%3A54%3A33IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFH&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Dieter,%20Torsten&rft.aucorp=Balzers%20Leybold%20Optics%20GmbH&rft.date=2003-04-15&rft_id=info:doi/&rft_dat=%3Cuspatents_EFH%3E06549291%3C/uspatents_EFH%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true