Apparatus and method including an efficient data transfer for analog to digital converter testing

The present invention relates to analog-to-digital converter testing and, more particularly, to an apparatus and method having an efficient data transfer scheme. The test system and method described herein reduces the production test time of semiconductor devices. More specifically, the apparatus me...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Variyam, Pramodchandran, Bapat, Sumant
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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