Apparatus and methods for non-destructive inspection using microwave sensing

Apparatus and methods for non-destructive inspection using microwave sensing

Apparatus and methods for materials inspection using microwave sensing are disclosed. In one aspect, a system for detecting corrosion of a workpiece includes a scanning assembly having a support assembly adapted to be coupled to the workpiece, and a first translation device coupled to the support as...

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Hauptverfasser: Fortner, David, Engelbart, Roger, Wood, Nancy
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Sprache:eng
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creator Fortner, David
Engelbart, Roger
Wood, Nancy
description Apparatus and methods for materials inspection using microwave sensing are disclosed. In one aspect, a system for detecting corrosion of a workpiece includes a scanning assembly having a support assembly adapted to be coupled to the workpiece, and a first translation device coupled to the support assembly. A microwave sensor is coupled to the first translation device. The first translation device is adapted to translate the microwave sensor along at least a first direction, and the microwave sensor is adapted to transmit incident microwave signals onto the workpiece and to receive reflected microwave signals reflected from the workpiece. In an alternate aspect, a system may further include a second translation device that is adapted to translate the microwave sensor along at least a second direction that is transverse to the first direction.
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fullrecord <record><control><sourceid>uspatents_EFI</sourceid><recordid>TN_cdi_uspatents_applications_20040251920</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>20040251920</sourcerecordid><originalsourceid>FETCH-uspatents_applications_200402519203</originalsourceid><addsrcrecordid>eNqVjLEKAjEQRNNYiPoP21ocxKjFlSKKhaX9sSR7GrjbLNlEf9878AesZnjzmKW5n0QwY6kKyAFGKq8UFPqUgRM3gbTk6kt8E0RWoakmhqqRnzBGn9MHp0mJZ7I2ix4Hpc0vV2Z7vTzOt6aqYCEu2qHIED3OL9o5aw_WHXets_t_3C8CYz2k</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Apparatus and methods for non-destructive inspection using microwave sensing</title><source>USPTO Published Applications</source><creator>Fortner, David ; Engelbart, Roger ; Wood, Nancy</creator><creatorcontrib>Fortner, David ; Engelbart, Roger ; Wood, Nancy</creatorcontrib><description>Apparatus and methods for materials inspection using microwave sensing are disclosed. In one aspect, a system for detecting corrosion of a workpiece includes a scanning assembly having a support assembly adapted to be coupled to the workpiece, and a first translation device coupled to the support assembly. A microwave sensor is coupled to the first translation device. The first translation device is adapted to translate the microwave sensor along at least a first direction, and the microwave sensor is adapted to transmit incident microwave signals onto the workpiece and to receive reflected microwave signals reflected from the workpiece. In an alternate aspect, a system may further include a second translation device that is adapted to translate the microwave sensor along at least a second direction that is transverse to the first direction.</description><language>eng</language><creationdate>2004</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20040251920$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,776,869,881,64032</link.rule.ids><linktorsrc>$$Uhttps://patentcenter.uspto.gov/applications/10459957$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Fortner, David</creatorcontrib><creatorcontrib>Engelbart, Roger</creatorcontrib><creatorcontrib>Wood, Nancy</creatorcontrib><title>Apparatus and methods for non-destructive inspection using microwave sensing</title><description>Apparatus and methods for materials inspection using microwave sensing are disclosed. In one aspect, a system for detecting corrosion of a workpiece includes a scanning assembly having a support assembly adapted to be coupled to the workpiece, and a first translation device coupled to the support assembly. A microwave sensor is coupled to the first translation device. The first translation device is adapted to translate the microwave sensor along at least a first direction, and the microwave sensor is adapted to transmit incident microwave signals onto the workpiece and to receive reflected microwave signals reflected from the workpiece. In an alternate aspect, a system may further include a second translation device that is adapted to translate the microwave sensor along at least a second direction that is transverse to the first direction.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2004</creationdate><recordtype>patent</recordtype><sourceid>EFI</sourceid><recordid>eNqVjLEKAjEQRNNYiPoP21ocxKjFlSKKhaX9sSR7GrjbLNlEf9878AesZnjzmKW5n0QwY6kKyAFGKq8UFPqUgRM3gbTk6kt8E0RWoakmhqqRnzBGn9MHp0mJZ7I2ix4Hpc0vV2Z7vTzOt6aqYCEu2qHIED3OL9o5aw_WHXets_t_3C8CYz2k</recordid><startdate>20041216</startdate><enddate>20041216</enddate><creator>Fortner, David</creator><creator>Engelbart, Roger</creator><creator>Wood, Nancy</creator><scope>EFI</scope></search><sort><creationdate>20041216</creationdate><title>Apparatus and methods for non-destructive inspection using microwave sensing</title><author>Fortner, David ; Engelbart, Roger ; Wood, Nancy</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_applications_200402519203</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2004</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Fortner, David</creatorcontrib><creatorcontrib>Engelbart, Roger</creatorcontrib><creatorcontrib>Wood, Nancy</creatorcontrib><collection>USPTO Published Applications</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Fortner, David</au><au>Engelbart, Roger</au><au>Wood, Nancy</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Apparatus and methods for non-destructive inspection using microwave sensing</title><date>2004-12-16</date><risdate>2004</risdate><abstract>Apparatus and methods for materials inspection using microwave sensing are disclosed. In one aspect, a system for detecting corrosion of a workpiece includes a scanning assembly having a support assembly adapted to be coupled to the workpiece, and a first translation device coupled to the support assembly. A microwave sensor is coupled to the first translation device. The first translation device is adapted to translate the microwave sensor along at least a first direction, and the microwave sensor is adapted to transmit incident microwave signals onto the workpiece and to receive reflected microwave signals reflected from the workpiece. In an alternate aspect, a system may further include a second translation device that is adapted to translate the microwave sensor along at least a second direction that is transverse to the first direction.</abstract><oa>free_for_read</oa></addata></record>
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title Apparatus and methods for non-destructive inspection using microwave sensing
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-11T18%3A37%3A32IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFI&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Fortner,%20David&rft.date=2004-12-16&rft_id=info:doi/&rft_dat=%3Cuspatents_EFI%3E20040251920%3C/uspatents_EFI%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true