Scanning probe microscope with improved probe head mount

Scanning probe microscope with improved probe head mount

A scanning probe microscope uses two different scanners (also called "scanning stages") that are completely detached each from the other, and are physically separated by a stationary frame. One scanner (called "x-y scanner") scans a sample in a plane (also called "x-y plane&...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Kim, Young, Kwon, Joonhyung, Park, Sang-il
Format: Patent
Sprache:eng
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Kim, Young
Kwon, Joonhyung
Park, Sang-il
description A scanning probe microscope uses two different scanners (also called "scanning stages") that are completely detached each from the other, and are physically separated by a stationary frame. One scanner (called "x-y scanner") scans a sample in a plane (also called "x-y plane"), while the other scanner (called "z scanner") scans a probe tip (which is supported at a free end of a cantilever) in a direction (also called "z direction") perpendicular to the plane. Detachment of the two scanners from one another eliminates crosstalk.
format Patent
fullrecord <record><control><sourceid>uspatents_EFI</sourceid><recordid>TN_cdi_uspatents_applications_20040140426</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>20040140426</sourcerecordid><originalsourceid>FETCH-uspatents_applications_200401404263</originalsourceid><addsrcrecordid>eNrjZLAITk7My8vMS1coKMpPSlXIzUwuyi9Ozi9IVSjPLMlQyMwFipelpkClM1ITUxRy80vzSngYWNMSc4pTeaE0N4Omm2uIs4duaXFBYklqXklxfGJBQU5mcmJJZn5ecbyRgYGJgaGJgYmRmTEpagGnxzV5</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Scanning probe microscope with improved probe head mount</title><source>USPTO Published Applications</source><creator>Kim, Young ; Kwon, Joonhyung ; Park, Sang-il</creator><creatorcontrib>Kim, Young ; Kwon, Joonhyung ; Park, Sang-il</creatorcontrib><description>A scanning probe microscope uses two different scanners (also called "scanning stages") that are completely detached each from the other, and are physically separated by a stationary frame. One scanner (called "x-y scanner") scans a sample in a plane (also called "x-y plane"), while the other scanner (called "z scanner") scans a probe tip (which is supported at a free end of a cantilever) in a direction (also called "z direction") perpendicular to the plane. Detachment of the two scanners from one another eliminates crosstalk.</description><language>eng</language><creationdate>2004</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20040140426$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,780,873,885,64059</link.rule.ids><linktorsrc>$$Uhttps://patentcenter.uspto.gov/applications/10755750$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Kim, Young</creatorcontrib><creatorcontrib>Kwon, Joonhyung</creatorcontrib><creatorcontrib>Park, Sang-il</creatorcontrib><title>Scanning probe microscope with improved probe head mount</title><description>A scanning probe microscope uses two different scanners (also called "scanning stages") that are completely detached each from the other, and are physically separated by a stationary frame. One scanner (called "x-y scanner") scans a sample in a plane (also called "x-y plane"), while the other scanner (called "z scanner") scans a probe tip (which is supported at a free end of a cantilever) in a direction (also called "z direction") perpendicular to the plane. Detachment of the two scanners from one another eliminates crosstalk.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2004</creationdate><recordtype>patent</recordtype><sourceid>EFI</sourceid><recordid>eNrjZLAITk7My8vMS1coKMpPSlXIzUwuyi9Ozi9IVSjPLMlQyMwFipelpkClM1ITUxRy80vzSngYWNMSc4pTeaE0N4Omm2uIs4duaXFBYklqXklxfGJBQU5mcmJJZn5ecbyRgYGJgaGJgYmRmTEpagGnxzV5</recordid><startdate>20040722</startdate><enddate>20040722</enddate><creator>Kim, Young</creator><creator>Kwon, Joonhyung</creator><creator>Park, Sang-il</creator><scope>EFI</scope></search><sort><creationdate>20040722</creationdate><title>Scanning probe microscope with improved probe head mount</title><author>Kim, Young ; Kwon, Joonhyung ; Park, Sang-il</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_applications_200401404263</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2004</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Kim, Young</creatorcontrib><creatorcontrib>Kwon, Joonhyung</creatorcontrib><creatorcontrib>Park, Sang-il</creatorcontrib><collection>USPTO Published Applications</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kim, Young</au><au>Kwon, Joonhyung</au><au>Park, Sang-il</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Scanning probe microscope with improved probe head mount</title><date>2004-07-22</date><risdate>2004</risdate><abstract>A scanning probe microscope uses two different scanners (also called "scanning stages") that are completely detached each from the other, and are physically separated by a stationary frame. One scanner (called "x-y scanner") scans a sample in a plane (also called "x-y plane"), while the other scanner (called "z scanner") scans a probe tip (which is supported at a free end of a cantilever) in a direction (also called "z direction") perpendicular to the plane. Detachment of the two scanners from one another eliminates crosstalk.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_uspatents_applications_20040140426
source USPTO Published Applications
title Scanning probe microscope with improved probe head mount
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-20T00%3A46%3A49IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFI&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Kim,%20Young&rft.date=2004-07-22&rft_id=info:doi/&rft_dat=%3Cuspatents_EFI%3E20040140426%3C/uspatents_EFI%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true