Electron microscope, method for operating the same, and computer-readable medium

Electron microscope, method for operating the same, and computer-readable medium

An electron microscope comprises a specimen designating section for designating a characteristic of a specimen, a simplified image observation condition setting section for setting one image observation conditions out of a plurality of simplified image observation conditions, which were set previous...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Furukawa, Hiroshi, Hirata, Tomohiko
Format: Patent
Sprache:eng
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Furukawa, Hiroshi
Hirata, Tomohiko
description An electron microscope comprises a specimen designating section for designating a characteristic of a specimen, a simplified image observation condition setting section for setting one image observation conditions out of a plurality of simplified image observation conditions, which were set previously to contain setting of a degree of vacuum, based on the characteristic of the specimen, and a preview setting section for setting a preview function that forms a plurality of simplified observation images simply based on a plurality of different simplified image observation conditions and displays them on a display section. A preview function of forming simply a plurality of observation images based on a plurality of image observation conditions containing a degree of vacuum as a parameter and then displaying them in a second display area is executed.
format Patent
fullrecord <record><control><sourceid>uspatents_EFI</sourceid><recordid>TN_cdi_uspatents_applications_20040108459</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>20040108459</sourcerecordid><originalsourceid>FETCH-uspatents_applications_200401084593</originalsourceid><addsrcrecordid>eNqVjLEKAjEQRNNYiPoP2woeRD1BazmxtLA_1mTvLpBkQ7L5f1P4A1bD8ObNWr0GT0YyRwjOZC6GEx0gkCxsYeIMrWcUF2eQhaBgaBijBcMhVaHcZUKLH09Nsq6GrVpN6AvtfrlR-8fwvj-7WhIKRSkjpuSdaaccy3jSutdHfe0vt_M_2y-R2z4p</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Electron microscope, method for operating the same, and computer-readable medium</title><source>USPTO Published Applications</source><creator>Furukawa, Hiroshi ; Hirata, Tomohiko</creator><creatorcontrib>Furukawa, Hiroshi ; Hirata, Tomohiko</creatorcontrib><description>An electron microscope comprises a specimen designating section for designating a characteristic of a specimen, a simplified image observation condition setting section for setting one image observation conditions out of a plurality of simplified image observation conditions, which were set previously to contain setting of a degree of vacuum, based on the characteristic of the specimen, and a preview setting section for setting a preview function that forms a plurality of simplified observation images simply based on a plurality of different simplified image observation conditions and displays them on a display section. A preview function of forming simply a plurality of observation images based on a plurality of image observation conditions containing a degree of vacuum as a parameter and then displaying them in a second display area is executed.</description><language>eng</language><creationdate>2004</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20040108459$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,780,873,885,64059</link.rule.ids><linktorsrc>$$Uhttps://patentcenter.uspto.gov/applications/10704006$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Furukawa, Hiroshi</creatorcontrib><creatorcontrib>Hirata, Tomohiko</creatorcontrib><title>Electron microscope, method for operating the same, and computer-readable medium</title><description>An electron microscope comprises a specimen designating section for designating a characteristic of a specimen, a simplified image observation condition setting section for setting one image observation conditions out of a plurality of simplified image observation conditions, which were set previously to contain setting of a degree of vacuum, based on the characteristic of the specimen, and a preview setting section for setting a preview function that forms a plurality of simplified observation images simply based on a plurality of different simplified image observation conditions and displays them on a display section. A preview function of forming simply a plurality of observation images based on a plurality of image observation conditions containing a degree of vacuum as a parameter and then displaying them in a second display area is executed.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2004</creationdate><recordtype>patent</recordtype><sourceid>EFI</sourceid><recordid>eNqVjLEKAjEQRNNYiPoP2woeRD1BazmxtLA_1mTvLpBkQ7L5f1P4A1bD8ObNWr0GT0YyRwjOZC6GEx0gkCxsYeIMrWcUF2eQhaBgaBijBcMhVaHcZUKLH09Nsq6GrVpN6AvtfrlR-8fwvj-7WhIKRSkjpuSdaaccy3jSutdHfe0vt_M_2y-R2z4p</recordid><startdate>20040610</startdate><enddate>20040610</enddate><creator>Furukawa, Hiroshi</creator><creator>Hirata, Tomohiko</creator><scope>EFI</scope></search><sort><creationdate>20040610</creationdate><title>Electron microscope, method for operating the same, and computer-readable medium</title><author>Furukawa, Hiroshi ; Hirata, Tomohiko</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_applications_200401084593</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2004</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Furukawa, Hiroshi</creatorcontrib><creatorcontrib>Hirata, Tomohiko</creatorcontrib><collection>USPTO Published Applications</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Furukawa, Hiroshi</au><au>Hirata, Tomohiko</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Electron microscope, method for operating the same, and computer-readable medium</title><date>2004-06-10</date><risdate>2004</risdate><abstract>An electron microscope comprises a specimen designating section for designating a characteristic of a specimen, a simplified image observation condition setting section for setting one image observation conditions out of a plurality of simplified image observation conditions, which were set previously to contain setting of a degree of vacuum, based on the characteristic of the specimen, and a preview setting section for setting a preview function that forms a plurality of simplified observation images simply based on a plurality of different simplified image observation conditions and displays them on a display section. A preview function of forming simply a plurality of observation images based on a plurality of image observation conditions containing a degree of vacuum as a parameter and then displaying them in a second display area is executed.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_uspatents_applications_20040108459
source USPTO Published Applications
title Electron microscope, method for operating the same, and computer-readable medium
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T07%3A59%3A16IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFI&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Furukawa,%20Hiroshi&rft.date=2004-06-10&rft_id=info:doi/&rft_dat=%3Cuspatents_EFI%3E20040108459%3C/uspatents_EFI%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true