Methods and apparatuses for analyzing solder plating solutions

The present invention relates to methods and apparatus for determining concentrations of various inorganic or organic components in solder plating solutions, which include titration or parallel titration methods, direct potentiometry methods, calibration methods, and/or UV-Vis absorption analysis.

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: King, Mackenzie, Robertson, Peter, Hilgarth, Monica, Schomburg, Cory, Tolmachev, Yuriy, Schoenrogge, Uwe
Format: Patent
Sprache:eng
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator King, Mackenzie
Robertson, Peter
Hilgarth, Monica
Schomburg, Cory
Tolmachev, Yuriy
Schoenrogge, Uwe
description The present invention relates to methods and apparatus for determining concentrations of various inorganic or organic components in solder plating solutions, which include titration or parallel titration methods, direct potentiometry methods, calibration methods, and/or UV-Vis absorption analysis.
format Patent
fullrecord <record><control><sourceid>uspatents_EFI</sourceid><recordid>TN_cdi_uspatents_applications_20040108224</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>20040108224</sourcerecordid><originalsourceid>FETCH-uspatents_applications_200401082243</originalsourceid><addsrcrecordid>eNrjZLDzTS3JyE8pVkjMS1FILChILEosKS1OLVZIyy8CiiXmVFZl5qUrFOfnpKQWKRTkJJZAuaUlmfl5xTwMrGmJOcWpvFCam0HTzTXE2UO3tLggsSQ1r6Q4HmhoTmZyIlh5vJGBgYmBoYGFkZGJMSlqAUwyOC8</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Methods and apparatuses for analyzing solder plating solutions</title><source>USPTO Published Applications</source><creator>King, Mackenzie ; Robertson, Peter ; Hilgarth, Monica ; Schomburg, Cory ; Tolmachev, Yuriy ; Schoenrogge, Uwe</creator><creatorcontrib>King, Mackenzie ; Robertson, Peter ; Hilgarth, Monica ; Schomburg, Cory ; Tolmachev, Yuriy ; Schoenrogge, Uwe</creatorcontrib><description>The present invention relates to methods and apparatus for determining concentrations of various inorganic or organic components in solder plating solutions, which include titration or parallel titration methods, direct potentiometry methods, calibration methods, and/or UV-Vis absorption analysis.</description><language>eng</language><creationdate>2004</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20040108224$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,780,873,885,64059</link.rule.ids><linktorsrc>$$Uhttps://patentcenter.uspto.gov/applications/10315629$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>King, Mackenzie</creatorcontrib><creatorcontrib>Robertson, Peter</creatorcontrib><creatorcontrib>Hilgarth, Monica</creatorcontrib><creatorcontrib>Schomburg, Cory</creatorcontrib><creatorcontrib>Tolmachev, Yuriy</creatorcontrib><creatorcontrib>Schoenrogge, Uwe</creatorcontrib><title>Methods and apparatuses for analyzing solder plating solutions</title><description>The present invention relates to methods and apparatus for determining concentrations of various inorganic or organic components in solder plating solutions, which include titration or parallel titration methods, direct potentiometry methods, calibration methods, and/or UV-Vis absorption analysis.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2004</creationdate><recordtype>patent</recordtype><sourceid>EFI</sourceid><recordid>eNrjZLDzTS3JyE8pVkjMS1FILChILEosKS1OLVZIyy8CiiXmVFZl5qUrFOfnpKQWKRTkJJZAuaUlmfl5xTwMrGmJOcWpvFCam0HTzTXE2UO3tLggsSQ1r6Q4HmhoTmZyIlh5vJGBgYmBoYGFkZGJMSlqAUwyOC8</recordid><startdate>20040610</startdate><enddate>20040610</enddate><creator>King, Mackenzie</creator><creator>Robertson, Peter</creator><creator>Hilgarth, Monica</creator><creator>Schomburg, Cory</creator><creator>Tolmachev, Yuriy</creator><creator>Schoenrogge, Uwe</creator><scope>EFI</scope></search><sort><creationdate>20040610</creationdate><title>Methods and apparatuses for analyzing solder plating solutions</title><author>King, Mackenzie ; Robertson, Peter ; Hilgarth, Monica ; Schomburg, Cory ; Tolmachev, Yuriy ; Schoenrogge, Uwe</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_applications_200401082243</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2004</creationdate><toplevel>online_resources</toplevel><creatorcontrib>King, Mackenzie</creatorcontrib><creatorcontrib>Robertson, Peter</creatorcontrib><creatorcontrib>Hilgarth, Monica</creatorcontrib><creatorcontrib>Schomburg, Cory</creatorcontrib><creatorcontrib>Tolmachev, Yuriy</creatorcontrib><creatorcontrib>Schoenrogge, Uwe</creatorcontrib><collection>USPTO Published Applications</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>King, Mackenzie</au><au>Robertson, Peter</au><au>Hilgarth, Monica</au><au>Schomburg, Cory</au><au>Tolmachev, Yuriy</au><au>Schoenrogge, Uwe</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Methods and apparatuses for analyzing solder plating solutions</title><date>2004-06-10</date><risdate>2004</risdate><abstract>The present invention relates to methods and apparatus for determining concentrations of various inorganic or organic components in solder plating solutions, which include titration or parallel titration methods, direct potentiometry methods, calibration methods, and/or UV-Vis absorption analysis.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_uspatents_applications_20040108224
source USPTO Published Applications
title Methods and apparatuses for analyzing solder plating solutions
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-27T18%3A10%3A44IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFI&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=King,%20Mackenzie&rft.date=2004-06-10&rft_id=info:doi/&rft_dat=%3Cuspatents_EFI%3E20040108224%3C/uspatents_EFI%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true