Methods and apparatuses for analyzing solder plating solutions
The present invention relates to methods and apparatus for determining concentrations of various inorganic or organic components in solder plating solutions, which include titration or parallel titration methods, direct potentiometry methods, calibration methods, and/or UV-Vis absorption analysis.
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creator | King, Mackenzie Robertson, Peter Hilgarth, Monica Schomburg, Cory Tolmachev, Yuriy Schoenrogge, Uwe |
description | The present invention relates to methods and apparatus for determining concentrations of various inorganic or organic components in solder plating solutions, which include titration or parallel titration methods, direct potentiometry methods, calibration methods, and/or UV-Vis absorption analysis. |
format | Patent |
fullrecord | <record><control><sourceid>uspatents_EFI</sourceid><recordid>TN_cdi_uspatents_applications_20040108224</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>20040108224</sourcerecordid><originalsourceid>FETCH-uspatents_applications_200401082243</originalsourceid><addsrcrecordid>eNrjZLDzTS3JyE8pVkjMS1FILChILEosKS1OLVZIyy8CiiXmVFZl5qUrFOfnpKQWKRTkJJZAuaUlmfl5xTwMrGmJOcWpvFCam0HTzTXE2UO3tLggsSQ1r6Q4HmhoTmZyIlh5vJGBgYmBoYGFkZGJMSlqAUwyOC8</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Methods and apparatuses for analyzing solder plating solutions</title><source>USPTO Published Applications</source><creator>King, Mackenzie ; Robertson, Peter ; Hilgarth, Monica ; Schomburg, Cory ; Tolmachev, Yuriy ; Schoenrogge, Uwe</creator><creatorcontrib>King, Mackenzie ; Robertson, Peter ; Hilgarth, Monica ; Schomburg, Cory ; Tolmachev, Yuriy ; Schoenrogge, Uwe</creatorcontrib><description>The present invention relates to methods and apparatus for determining concentrations of various inorganic or organic components in solder plating solutions, which include titration or parallel titration methods, direct potentiometry methods, calibration methods, and/or UV-Vis absorption analysis.</description><language>eng</language><creationdate>2004</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20040108224$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,780,873,885,64059</link.rule.ids><linktorsrc>$$Uhttps://patentcenter.uspto.gov/applications/10315629$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>King, Mackenzie</creatorcontrib><creatorcontrib>Robertson, Peter</creatorcontrib><creatorcontrib>Hilgarth, Monica</creatorcontrib><creatorcontrib>Schomburg, Cory</creatorcontrib><creatorcontrib>Tolmachev, Yuriy</creatorcontrib><creatorcontrib>Schoenrogge, Uwe</creatorcontrib><title>Methods and apparatuses for analyzing solder plating solutions</title><description>The present invention relates to methods and apparatus for determining concentrations of various inorganic or organic components in solder plating solutions, which include titration or parallel titration methods, direct potentiometry methods, calibration methods, and/or UV-Vis absorption analysis.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2004</creationdate><recordtype>patent</recordtype><sourceid>EFI</sourceid><recordid>eNrjZLDzTS3JyE8pVkjMS1FILChILEosKS1OLVZIyy8CiiXmVFZl5qUrFOfnpKQWKRTkJJZAuaUlmfl5xTwMrGmJOcWpvFCam0HTzTXE2UO3tLggsSQ1r6Q4HmhoTmZyIlh5vJGBgYmBoYGFkZGJMSlqAUwyOC8</recordid><startdate>20040610</startdate><enddate>20040610</enddate><creator>King, Mackenzie</creator><creator>Robertson, Peter</creator><creator>Hilgarth, Monica</creator><creator>Schomburg, Cory</creator><creator>Tolmachev, Yuriy</creator><creator>Schoenrogge, Uwe</creator><scope>EFI</scope></search><sort><creationdate>20040610</creationdate><title>Methods and apparatuses for analyzing solder plating solutions</title><author>King, Mackenzie ; Robertson, Peter ; Hilgarth, Monica ; Schomburg, Cory ; Tolmachev, Yuriy ; Schoenrogge, Uwe</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_applications_200401082243</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2004</creationdate><toplevel>online_resources</toplevel><creatorcontrib>King, Mackenzie</creatorcontrib><creatorcontrib>Robertson, Peter</creatorcontrib><creatorcontrib>Hilgarth, Monica</creatorcontrib><creatorcontrib>Schomburg, Cory</creatorcontrib><creatorcontrib>Tolmachev, Yuriy</creatorcontrib><creatorcontrib>Schoenrogge, Uwe</creatorcontrib><collection>USPTO Published Applications</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>King, Mackenzie</au><au>Robertson, Peter</au><au>Hilgarth, Monica</au><au>Schomburg, Cory</au><au>Tolmachev, Yuriy</au><au>Schoenrogge, Uwe</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Methods and apparatuses for analyzing solder plating solutions</title><date>2004-06-10</date><risdate>2004</risdate><abstract>The present invention relates to methods and apparatus for determining concentrations of various inorganic or organic components in solder plating solutions, which include titration or parallel titration methods, direct potentiometry methods, calibration methods, and/or UV-Vis absorption analysis.</abstract><oa>free_for_read</oa></addata></record> |
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title | Methods and apparatuses for analyzing solder plating solutions |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-27T18%3A10%3A44IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFI&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=King,%20Mackenzie&rft.date=2004-06-10&rft_id=info:doi/&rft_dat=%3Cuspatents_EFI%3E20040108224%3C/uspatents_EFI%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |