Calibration standard for high resolution electron microscopy

Calibration standard for high resolution electron microscopy

A method and apparatus used to calibrate high-resolution electron microscopes where a single standard provides multiple samples, each having a different atomic structure, permits rapid accurate calibration of the entire range of magnifications. The different atomic structure dimensions possess known...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Vartuli, Catherine, Houge, Erik, Mclntosh, John, Stevie, Fred
Format: Patent
Sprache:eng
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Vartuli, Catherine
Houge, Erik
Mclntosh, John
Stevie, Fred
description A method and apparatus used to calibrate high-resolution electron microscopes where a single standard provides multiple samples, each having a different atomic structure, permits rapid accurate calibration of the entire range of magnifications. The different atomic structure dimensions possess known reference measurement data. The S/TEM is adjusted to focus onto the crystal lattice structure of each sample in a selected sequence. Measurements of these lattice spacings are compared to known dimensions. If S/TEM measurements do not agree with the lattice spacing dimensions, the S/TEM magnification is adjusted to reflect known dimensions. Typical standard exchange and associated processing steps are eliminated by the use of the single standard comprising of a plurality of samples.
format Patent
fullrecord <record><control><sourceid>uspatents_EFI</sourceid><recordid>TN_cdi_uspatents_applications_20030193022</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>20030193022</sourcerecordid><originalsourceid>FETCH-uspatents_applications_200301930223</originalsourceid><addsrcrecordid>eNrjZLBxTszJTCpKLMnMz1MoLknMS0ksSlFIyy9SyMhMz1AoSi3OzykFS6bmpCaXFAEZuZnJRfnFyfkFlTwMrGmJOcWpvFCam0HTzTXE2UO3tLggsSQ1r6Q4PrGgICczGWx8cbyRgYGxgaGlsYGRkTEpagHU4Dd3</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Calibration standard for high resolution electron microscopy</title><source>USPTO Published Applications</source><creator>Vartuli, Catherine ; Houge, Erik ; Mclntosh, John ; Stevie, Fred</creator><creatorcontrib>Vartuli, Catherine ; Houge, Erik ; Mclntosh, John ; Stevie, Fred</creatorcontrib><description>A method and apparatus used to calibrate high-resolution electron microscopes where a single standard provides multiple samples, each having a different atomic structure, permits rapid accurate calibration of the entire range of magnifications. The different atomic structure dimensions possess known reference measurement data. The S/TEM is adjusted to focus onto the crystal lattice structure of each sample in a selected sequence. Measurements of these lattice spacings are compared to known dimensions. If S/TEM measurements do not agree with the lattice spacing dimensions, the S/TEM magnification is adjusted to reflect known dimensions. Typical standard exchange and associated processing steps are eliminated by the use of the single standard comprising of a plurality of samples.</description><language>eng</language><creationdate>2003</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20030193022$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,776,869,881,64032</link.rule.ids><linktorsrc>$$Uhttps://patentcenter.uspto.gov/applications/10122645$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Vartuli, Catherine</creatorcontrib><creatorcontrib>Houge, Erik</creatorcontrib><creatorcontrib>Mclntosh, John</creatorcontrib><creatorcontrib>Stevie, Fred</creatorcontrib><title>Calibration standard for high resolution electron microscopy</title><description>A method and apparatus used to calibrate high-resolution electron microscopes where a single standard provides multiple samples, each having a different atomic structure, permits rapid accurate calibration of the entire range of magnifications. The different atomic structure dimensions possess known reference measurement data. The S/TEM is adjusted to focus onto the crystal lattice structure of each sample in a selected sequence. Measurements of these lattice spacings are compared to known dimensions. If S/TEM measurements do not agree with the lattice spacing dimensions, the S/TEM magnification is adjusted to reflect known dimensions. Typical standard exchange and associated processing steps are eliminated by the use of the single standard comprising of a plurality of samples.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2003</creationdate><recordtype>patent</recordtype><sourceid>EFI</sourceid><recordid>eNrjZLBxTszJTCpKLMnMz1MoLknMS0ksSlFIyy9SyMhMz1AoSi3OzykFS6bmpCaXFAEZuZnJRfnFyfkFlTwMrGmJOcWpvFCam0HTzTXE2UO3tLggsSQ1r6Q4PrGgICczGWx8cbyRgYGxgaGlsYGRkTEpagHU4Dd3</recordid><startdate>20031016</startdate><enddate>20031016</enddate><creator>Vartuli, Catherine</creator><creator>Houge, Erik</creator><creator>Mclntosh, John</creator><creator>Stevie, Fred</creator><scope>EFI</scope></search><sort><creationdate>20031016</creationdate><title>Calibration standard for high resolution electron microscopy</title><author>Vartuli, Catherine ; Houge, Erik ; Mclntosh, John ; Stevie, Fred</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_applications_200301930223</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2003</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Vartuli, Catherine</creatorcontrib><creatorcontrib>Houge, Erik</creatorcontrib><creatorcontrib>Mclntosh, John</creatorcontrib><creatorcontrib>Stevie, Fred</creatorcontrib><collection>USPTO Published Applications</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Vartuli, Catherine</au><au>Houge, Erik</au><au>Mclntosh, John</au><au>Stevie, Fred</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Calibration standard for high resolution electron microscopy</title><date>2003-10-16</date><risdate>2003</risdate><abstract>A method and apparatus used to calibrate high-resolution electron microscopes where a single standard provides multiple samples, each having a different atomic structure, permits rapid accurate calibration of the entire range of magnifications. The different atomic structure dimensions possess known reference measurement data. The S/TEM is adjusted to focus onto the crystal lattice structure of each sample in a selected sequence. Measurements of these lattice spacings are compared to known dimensions. If S/TEM measurements do not agree with the lattice spacing dimensions, the S/TEM magnification is adjusted to reflect known dimensions. Typical standard exchange and associated processing steps are eliminated by the use of the single standard comprising of a plurality of samples.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_uspatents_applications_20030193022
source USPTO Published Applications
title Calibration standard for high resolution electron microscopy
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-03T02%3A13%3A54IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFI&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Vartuli,%20Catherine&rft.date=2003-10-16&rft_id=info:doi/&rft_dat=%3Cuspatents_EFI%3E20030193022%3C/uspatents_EFI%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true