Apparatus and method for treating a measuring probe
1. An apparatus for treating a measuring probe has a treatment chamber ( 104 ) with a chamber inlet ( 106 ) and a chamber outlet ( 108 ). A conveyor device ( 110 ) selectively conveys one of a plurality of treatment media (G, W, R, E, Z) from its respective supply port ( 118 a , 118 b, 118 c, 118 d,...
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| creator | Ruegg, Matthias Laragne, Jean Caderas, Daniel |
| description | 1. An apparatus for treating a measuring probe has a treatment chamber (
104
) with a chamber inlet (
106
) and a chamber outlet (
108
). A conveyor device (
110
) selectively conveys one of a plurality of treatment media (G, W, R, E, Z) from its respective supply port (
118
a
, 118
b,
118
c,
118
d,
118
e
) to the chamber inlet (
106
) and into the treatment chamber (
104
). The conveyor device (
110
) has a collector conduit (
120
) and a conveyor pump (
122
), the latter arranged between the collector conduit (
120
) and the chamber inlet (
106
). Each of the supply ports (
118
a,
118
b,
118
c,
118
d,
118
e
) has its own shutter device (
124
a,
124
b,
124
c,
124
d,
124
e
) arranged directly at the collector conduit (
120
). |
| format | Patent |
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104
) with a chamber inlet (
106
) and a chamber outlet (
108
). A conveyor device (
110
) selectively conveys one of a plurality of treatment media (G, W, R, E, Z) from its respective supply port (
118
a
, 118
b,
118
c,
118
d,
118
e
) to the chamber inlet (
106
) and into the treatment chamber (
104
). The conveyor device (
110
) has a collector conduit (
120
) and a conveyor pump (
122
), the latter arranged between the collector conduit (
120
) and the chamber inlet (
106
). Each of the supply ports (
118
a,
118
b,
118
c,
118
d,
118
e
) has its own shutter device (
124
a,
124
b,
124
c,
124
d,
124
e
) arranged directly at the collector conduit (
120
).</description><language>eng</language><creationdate>2003</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20030019749$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,780,873,885,64059</link.rule.ids><linktorsrc>$$Uhttps://patentcenter.uspto.gov/applications/10202145$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Ruegg, Matthias</creatorcontrib><creatorcontrib>Laragne, Jean</creatorcontrib><creatorcontrib>Caderas, Daniel</creatorcontrib><title>Apparatus and method for treating a measuring probe</title><description>1. An apparatus for treating a measuring probe has a treatment chamber (
104
) with a chamber inlet (
106
) and a chamber outlet (
108
). A conveyor device (
110
) selectively conveys one of a plurality of treatment media (G, W, R, E, Z) from its respective supply port (
118
a
, 118
b,
118
c,
118
d,
118
e
) to the chamber inlet (
106
) and into the treatment chamber (
104
). The conveyor device (
110
) has a collector conduit (
120
) and a conveyor pump (
122
), the latter arranged between the collector conduit (
120
) and the chamber inlet (
106
). Each of the supply ports (
118
a,
118
b,
118
c,
118
d,
118
e
) has its own shutter device (
124
a,
124
b,
124
c,
124
d,
124
e
) arranged directly at the collector conduit (
120
).</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2003</creationdate><recordtype>patent</recordtype><sourceid>EFI</sourceid><recordid>eNrjZDB2LChILEosKS1WSMxLUchNLcnIT1FIyy9SKClKTSzJzEtXSASKJhaXFoHYBUX5Sak8DKxpiTnFqbxQmptB0801xNlDt7S4ILEkNa-kOD6xoCAnMxmoPz-vON7IwMDYwMDQ0tzE0pgUtQBSIzNe</recordid><startdate>20030130</startdate><enddate>20030130</enddate><creator>Ruegg, Matthias</creator><creator>Laragne, Jean</creator><creator>Caderas, Daniel</creator><scope>EFI</scope></search><sort><creationdate>20030130</creationdate><title>Apparatus and method for treating a measuring probe</title><author>Ruegg, Matthias ; Laragne, Jean ; Caderas, Daniel</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_applications_200300197493</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2003</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Ruegg, Matthias</creatorcontrib><creatorcontrib>Laragne, Jean</creatorcontrib><creatorcontrib>Caderas, Daniel</creatorcontrib><collection>USPTO Published Applications</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Ruegg, Matthias</au><au>Laragne, Jean</au><au>Caderas, Daniel</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Apparatus and method for treating a measuring probe</title><date>2003-01-30</date><risdate>2003</risdate><abstract>1. An apparatus for treating a measuring probe has a treatment chamber (
104
) with a chamber inlet (
106
) and a chamber outlet (
108
). A conveyor device (
110
) selectively conveys one of a plurality of treatment media (G, W, R, E, Z) from its respective supply port (
118
a
, 118
b,
118
c,
118
d,
118
e
) to the chamber inlet (
106
) and into the treatment chamber (
104
). The conveyor device (
110
) has a collector conduit (
120
) and a conveyor pump (
122
), the latter arranged between the collector conduit (
120
) and the chamber inlet (
106
). Each of the supply ports (
118
a,
118
b,
118
c,
118
d,
118
e
) has its own shutter device (
124
a,
124
b,
124
c,
124
d,
124
e
) arranged directly at the collector conduit (
120
).</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng |
| recordid | cdi_uspatents_applications_20030019749 |
| source | USPTO Published Applications |
| title | Apparatus and method for treating a measuring probe |
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