Optical absorption measuring instrument

An optical absorption measuring instrument for determining the percentage of a component in a fluid shall be improved such that changes in the measuring radiation caused by drift or temperature have only a limited effect on the measuring result. Provisions are made for deflecting the measuring beams...

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1. Verfasser: Matthiessen, Hans
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creator Matthiessen, Hans
description An optical absorption measuring instrument for determining the percentage of a component in a fluid shall be improved such that changes in the measuring radiation caused by drift or temperature have only a limited effect on the measuring result. Provisions are made for deflecting the measuring beams ( 10, 11 ) from a radiation source ( 4 ) to a detector ( 5 ) by at least two plane mirrors ( 71, 72 ), which are positioned such that the measuring beams ( 10, 11 ) emitted by the radiation source ( 4 ) are deflected to the detector ( 5 ). The surface of each plane mirror ( 71, 72 ) is dimensioned to be such that its illuminated surface in the area of the detector ( 5 ) is larger than the receiving surface ( 12 ) of the detector ( 5 ).
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fullrecord <record><control><sourceid>uspatents_EFI</sourceid><recordid>TN_cdi_uspatents_applications_20030002044</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>20030002044</sourcerecordid><originalsourceid>FETCH-uspatents_applications_200300020443</originalsourceid><addsrcrecordid>eNrjZFD3LyjJTE7MUUhMKs4vArLz8xRyUxOLS4sy89IVMvOKS4pKc1PzSngYWNMSc4pTeaE0N4Omm2uIs4duaXFBYglQQXF8YkFBDtAokBHF8UYGBsYGBgZGBiYmxqSoBQANTS-N</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Optical absorption measuring instrument</title><source>USPTO Published Applications</source><creator>Matthiessen, Hans</creator><creatorcontrib>Matthiessen, Hans</creatorcontrib><description>An optical absorption measuring instrument for determining the percentage of a component in a fluid shall be improved such that changes in the measuring radiation caused by drift or temperature have only a limited effect on the measuring result. Provisions are made for deflecting the measuring beams ( 10, 11 ) from a radiation source ( 4 ) to a detector ( 5 ) by at least two plane mirrors ( 71, 72 ), which are positioned such that the measuring beams ( 10, 11 ) emitted by the radiation source ( 4 ) are deflected to the detector ( 5 ). The surface of each plane mirror ( 71, 72 ) is dimensioned to be such that its illuminated surface in the area of the detector ( 5 ) is larger than the receiving surface ( 12 ) of the detector ( 5 ).</description><language>eng</language><creationdate>2003</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20030002044$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,780,873,885,64059</link.rule.ids><linktorsrc>$$Uhttps://patentcenter.uspto.gov/applications/10105766$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Matthiessen, Hans</creatorcontrib><title>Optical absorption measuring instrument</title><description>An optical absorption measuring instrument for determining the percentage of a component in a fluid shall be improved such that changes in the measuring radiation caused by drift or temperature have only a limited effect on the measuring result. Provisions are made for deflecting the measuring beams ( 10, 11 ) from a radiation source ( 4 ) to a detector ( 5 ) by at least two plane mirrors ( 71, 72 ), which are positioned such that the measuring beams ( 10, 11 ) emitted by the radiation source ( 4 ) are deflected to the detector ( 5 ). The surface of each plane mirror ( 71, 72 ) is dimensioned to be such that its illuminated surface in the area of the detector ( 5 ) is larger than the receiving surface ( 12 ) of the detector ( 5 ).</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2003</creationdate><recordtype>patent</recordtype><sourceid>EFI</sourceid><recordid>eNrjZFD3LyjJTE7MUUhMKs4vArLz8xRyUxOLS4sy89IVMvOKS4pKc1PzSngYWNMSc4pTeaE0N4Omm2uIs4duaXFBYglQQXF8YkFBDtAokBHF8UYGBsYGBgZGBiYmxqSoBQANTS-N</recordid><startdate>20030102</startdate><enddate>20030102</enddate><creator>Matthiessen, Hans</creator><scope>EFI</scope></search><sort><creationdate>20030102</creationdate><title>Optical absorption measuring instrument</title><author>Matthiessen, Hans</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_applications_200300020443</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2003</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Matthiessen, Hans</creatorcontrib><collection>USPTO Published Applications</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Matthiessen, Hans</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Optical absorption measuring instrument</title><date>2003-01-02</date><risdate>2003</risdate><abstract>An optical absorption measuring instrument for determining the percentage of a component in a fluid shall be improved such that changes in the measuring radiation caused by drift or temperature have only a limited effect on the measuring result. Provisions are made for deflecting the measuring beams ( 10, 11 ) from a radiation source ( 4 ) to a detector ( 5 ) by at least two plane mirrors ( 71, 72 ), which are positioned such that the measuring beams ( 10, 11 ) emitted by the radiation source ( 4 ) are deflected to the detector ( 5 ). The surface of each plane mirror ( 71, 72 ) is dimensioned to be such that its illuminated surface in the area of the detector ( 5 ) is larger than the receiving surface ( 12 ) of the detector ( 5 ).</abstract><oa>free_for_read</oa></addata></record>
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title Optical absorption measuring instrument
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T06%3A24%3A26IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFI&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Matthiessen,%20Hans&rft.date=2003-01-02&rft_id=info:doi/&rft_dat=%3Cuspatents_EFI%3E20030002044%3C/uspatents_EFI%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true