Electronic device evaluation system
An electronic device evaluation system ( 100 ) includes a potential customer located at a site ( 102 ) that accesses a company site ( 106 ) via a computer network such as the internet ( 104 ). The company site ( 106 ) includes a computer such as a server ( 108 ) which is coupled to one or more evalu...
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creator | Nguyen, Kevin Bartolome, Eduardo |
description | An electronic device evaluation system (
100
) includes a potential customer located at a site (
102
) that accesses a company site (
106
) via a computer network such as the internet (
104
). The company site (
106
) includes a computer such as a server (
108
) which is coupled to one or more evaluation boards (
110, 112
) and instrumentation (
114
). Using the system (
100
) a potential customer or visitor can remotely evaluate an electronic device or system of interest using parameters he selects and the results are sent back after the evaluation is conducted at the company site (
106
). Using system (
100
) potential customers, site visitors, etc. can evaluate electronic devices/systems of interest in real-time without the need to purchase an evaluation board and spend the time and resources needed to conduct the tests. |
format | Patent |
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100
) includes a potential customer located at a site (
102
) that accesses a company site (
106
) via a computer network such as the internet (
104
). The company site (
106
) includes a computer such as a server (
108
) which is coupled to one or more evaluation boards (
110, 112
) and instrumentation (
114
). Using the system (
100
) a potential customer or visitor can remotely evaluate an electronic device or system of interest using parameters he selects and the results are sent back after the evaluation is conducted at the company site (
106
). Using system (
100
) potential customers, site visitors, etc. can evaluate electronic devices/systems of interest in real-time without the need to purchase an evaluation board and spend the time and resources needed to conduct the tests.</description><language>eng</language><creationdate>2002</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20020183974$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,780,873,885,64059</link.rule.ids><linktorsrc>$$Uhttps://patentcenter.uspto.gov/applications/09870081$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Nguyen, Kevin</creatorcontrib><creatorcontrib>Bartolome, Eduardo</creatorcontrib><title>Electronic device evaluation system</title><description>An electronic device evaluation system (
100
) includes a potential customer located at a site (
102
) that accesses a company site (
106
) via a computer network such as the internet (
104
). The company site (
106
) includes a computer such as a server (
108
) which is coupled to one or more evaluation boards (
110, 112
) and instrumentation (
114
). Using the system (
100
) a potential customer or visitor can remotely evaluate an electronic device or system of interest using parameters he selects and the results are sent back after the evaluation is conducted at the company site (
106
). Using system (
100
) potential customers, site visitors, etc. can evaluate electronic devices/systems of interest in real-time without the need to purchase an evaluation board and spend the time and resources needed to conduct the tests.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2002</creationdate><recordtype>patent</recordtype><sourceid>EFI</sourceid><recordid>eNrjZFB2zUlNLinKz8tMVkhJLctMTlVILUvMKU0syczPUyiuLC5JzeVhYE1LzClO5YXS3Ayabq4hzh66pcUFiSWpeSXF8YkFBTmZyWBNxfFGBgZGBoYWxpbmJsakqAUADtot1w</recordid><startdate>20021205</startdate><enddate>20021205</enddate><creator>Nguyen, Kevin</creator><creator>Bartolome, Eduardo</creator><scope>EFI</scope></search><sort><creationdate>20021205</creationdate><title>Electronic device evaluation system</title><author>Nguyen, Kevin ; Bartolome, Eduardo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_applications_200201839743</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2002</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Nguyen, Kevin</creatorcontrib><creatorcontrib>Bartolome, Eduardo</creatorcontrib><collection>USPTO Published Applications</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Nguyen, Kevin</au><au>Bartolome, Eduardo</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Electronic device evaluation system</title><date>2002-12-05</date><risdate>2002</risdate><abstract>An electronic device evaluation system (
100
) includes a potential customer located at a site (
102
) that accesses a company site (
106
) via a computer network such as the internet (
104
). The company site (
106
) includes a computer such as a server (
108
) which is coupled to one or more evaluation boards (
110, 112
) and instrumentation (
114
). Using the system (
100
) a potential customer or visitor can remotely evaluate an electronic device or system of interest using parameters he selects and the results are sent back after the evaluation is conducted at the company site (
106
). Using system (
100
) potential customers, site visitors, etc. can evaluate electronic devices/systems of interest in real-time without the need to purchase an evaluation board and spend the time and resources needed to conduct the tests.</abstract><oa>free_for_read</oa></addata></record> |
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language | eng |
recordid | cdi_uspatents_applications_20020183974 |
source | USPTO Published Applications |
title | Electronic device evaluation system |
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