Electronic device evaluation system

An electronic device evaluation system ( 100 ) includes a potential customer located at a site ( 102 ) that accesses a company site ( 106 ) via a computer network such as the internet ( 104 ). The company site ( 106 ) includes a computer such as a server ( 108 ) which is coupled to one or more evalu...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Nguyen, Kevin, Bartolome, Eduardo
Format: Patent
Sprache:eng
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Nguyen, Kevin
Bartolome, Eduardo
description An electronic device evaluation system ( 100 ) includes a potential customer located at a site ( 102 ) that accesses a company site ( 106 ) via a computer network such as the internet ( 104 ). The company site ( 106 ) includes a computer such as a server ( 108 ) which is coupled to one or more evaluation boards ( 110, 112 ) and instrumentation ( 114 ). Using the system ( 100 ) a potential customer or visitor can remotely evaluate an electronic device or system of interest using parameters he selects and the results are sent back after the evaluation is conducted at the company site ( 106 ). Using system ( 100 ) potential customers, site visitors, etc. can evaluate electronic devices/systems of interest in real-time without the need to purchase an evaluation board and spend the time and resources needed to conduct the tests.
format Patent
fullrecord <record><control><sourceid>uspatents_EFI</sourceid><recordid>TN_cdi_uspatents_applications_20020183974</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>20020183974</sourcerecordid><originalsourceid>FETCH-uspatents_applications_200201839743</originalsourceid><addsrcrecordid>eNrjZFB2zUlNLinKz8tMVkhJLctMTlVILUvMKU0syczPUyiuLC5JzeVhYE1LzClO5YXS3Ayabq4hzh66pcUFiSWpeSXF8YkFBTmZyWBNxfFGBgZGBoYWxpbmJsakqAUADtot1w</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Electronic device evaluation system</title><source>USPTO Published Applications</source><creator>Nguyen, Kevin ; Bartolome, Eduardo</creator><creatorcontrib>Nguyen, Kevin ; Bartolome, Eduardo</creatorcontrib><description>An electronic device evaluation system ( 100 ) includes a potential customer located at a site ( 102 ) that accesses a company site ( 106 ) via a computer network such as the internet ( 104 ). The company site ( 106 ) includes a computer such as a server ( 108 ) which is coupled to one or more evaluation boards ( 110, 112 ) and instrumentation ( 114 ). Using the system ( 100 ) a potential customer or visitor can remotely evaluate an electronic device or system of interest using parameters he selects and the results are sent back after the evaluation is conducted at the company site ( 106 ). Using system ( 100 ) potential customers, site visitors, etc. can evaluate electronic devices/systems of interest in real-time without the need to purchase an evaluation board and spend the time and resources needed to conduct the tests.</description><language>eng</language><creationdate>2002</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20020183974$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,780,873,885,64059</link.rule.ids><linktorsrc>$$Uhttps://patentcenter.uspto.gov/applications/09870081$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Nguyen, Kevin</creatorcontrib><creatorcontrib>Bartolome, Eduardo</creatorcontrib><title>Electronic device evaluation system</title><description>An electronic device evaluation system ( 100 ) includes a potential customer located at a site ( 102 ) that accesses a company site ( 106 ) via a computer network such as the internet ( 104 ). The company site ( 106 ) includes a computer such as a server ( 108 ) which is coupled to one or more evaluation boards ( 110, 112 ) and instrumentation ( 114 ). Using the system ( 100 ) a potential customer or visitor can remotely evaluate an electronic device or system of interest using parameters he selects and the results are sent back after the evaluation is conducted at the company site ( 106 ). Using system ( 100 ) potential customers, site visitors, etc. can evaluate electronic devices/systems of interest in real-time without the need to purchase an evaluation board and spend the time and resources needed to conduct the tests.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2002</creationdate><recordtype>patent</recordtype><sourceid>EFI</sourceid><recordid>eNrjZFB2zUlNLinKz8tMVkhJLctMTlVILUvMKU0syczPUyiuLC5JzeVhYE1LzClO5YXS3Ayabq4hzh66pcUFiSWpeSXF8YkFBTmZyWBNxfFGBgZGBoYWxpbmJsakqAUADtot1w</recordid><startdate>20021205</startdate><enddate>20021205</enddate><creator>Nguyen, Kevin</creator><creator>Bartolome, Eduardo</creator><scope>EFI</scope></search><sort><creationdate>20021205</creationdate><title>Electronic device evaluation system</title><author>Nguyen, Kevin ; Bartolome, Eduardo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_applications_200201839743</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2002</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Nguyen, Kevin</creatorcontrib><creatorcontrib>Bartolome, Eduardo</creatorcontrib><collection>USPTO Published Applications</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Nguyen, Kevin</au><au>Bartolome, Eduardo</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Electronic device evaluation system</title><date>2002-12-05</date><risdate>2002</risdate><abstract>An electronic device evaluation system ( 100 ) includes a potential customer located at a site ( 102 ) that accesses a company site ( 106 ) via a computer network such as the internet ( 104 ). The company site ( 106 ) includes a computer such as a server ( 108 ) which is coupled to one or more evaluation boards ( 110, 112 ) and instrumentation ( 114 ). Using the system ( 100 ) a potential customer or visitor can remotely evaluate an electronic device or system of interest using parameters he selects and the results are sent back after the evaluation is conducted at the company site ( 106 ). Using system ( 100 ) potential customers, site visitors, etc. can evaluate electronic devices/systems of interest in real-time without the need to purchase an evaluation board and spend the time and resources needed to conduct the tests.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_uspatents_applications_20020183974
source USPTO Published Applications
title Electronic device evaluation system
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T22%3A14%3A37IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFI&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Nguyen,%20Kevin&rft.date=2002-12-05&rft_id=info:doi/&rft_dat=%3Cuspatents_EFI%3E20020183974%3C/uspatents_EFI%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true