Method and apparatus for revising wiring of a circuit to prevent electro-migration

A wiring designing method for electrically connecting a plurality of functional blocks on a semiconductor integrated circuit is disclosed, that comprises the steps of (a) obtaining a wiring branch point among the plurality of functional blocks, (b) obtaining a current density of the obtained wiring...

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1. Verfasser:	Shiratori, Yuko
Format:	Patent
Sprache:	eng
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creator	Shiratori, Yuko
description	A wiring designing method for electrically connecting a plurality of functional blocks on a semiconductor integrated circuit is disclosed, that comprises the steps of (a) obtaining a wiring branch point among the plurality of functional blocks, (b) obtaining a current density of the obtained wiring branch point, (c) determining whether or not the obtained current density exceeds a predetermined limit value, and (d) performing a process for decreasing a current density of a predetermined wiring portion that ends at the wiring branch portion whose current density exceeds the limit value corresponding to the determined result at the determining step (c).
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semiconductor integrated circuit is disclosed, that comprises the steps of (a) obtaining a wiring branch point among the plurality of functional blocks, (b) obtaining a current density of the obtained wiring branch point, (c) determining whether or not the obtained current density exceeds a predetermined limit value, and (d) performing a process for decreasing a current density of a predetermined wiring portion that ends at the wiring branch portion whose current density exceeds the limit value corresponding to the determined result at the determining step 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of (a) obtaining a wiring branch point among the plurality of functional blocks, (b) obtaining a current density of the obtained wiring branch point, (c) determining whether or not the obtained current density exceeds a predetermined limit value, and (d) performing a process for decreasing a current density of a predetermined wiring portion that ends at the wiring branch portion whose current density exceeds the limit value corresponding to the determined result at the determining step (c).</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2002</creationdate><recordtype>patent</recordtype><sourceid>EFI</sourceid><recordid>eNqVjbEKAjEQRK-xEPUftrU4ODwVrEWxsRH7Y4nJuRCzYXejv28Uf0CYYZr3mGlzOXu78w0w1eaMglYUAguIf5JSGuFF8hkOgOBIXCEDY8gV8MnAR-9MuH3QWGXiNG8mAaP6xW9nzfJ4uO5PbdGMVhUd6lMk96V1WHVdzW6zXff9P-wbPpA_Pw</recordid><startdate>20020718</startdate><enddate>20020718</enddate><creator>Shiratori, Yuko</creator><scope>EFI</scope></search><sort><creationdate>20020718</creationdate><title>Method and apparatus for revising wiring of a circuit to prevent electro-migration</title><author>Shiratori, Yuko</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_applications_200200956433</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2002</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Shiratori, Yuko</creatorcontrib><collection>USPTO Published Applications</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Shiratori, Yuko</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method and apparatus for revising wiring of a circuit to prevent electro-migration</title><date>2002-07-18</date><risdate>2002</risdate><abstract>A wiring designing method for electrically connecting a plurality of functional blocks on a semiconductor integrated circuit is disclosed, that comprises the steps of (a) obtaining a wiring branch point among the plurality of functional blocks, (b) obtaining a current density of the obtained wiring branch point, (c) determining whether or not the obtained current density exceeds a predetermined limit value, and (d) performing a process for decreasing a current density of a predetermined wiring portion that ends at the wiring branch portion whose current density exceeds the limit value corresponding to the determined result at the determining step (c).</abstract><oa>free_for_read</oa></addata></record>
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recordid	cdi_uspatents_applications_20020095643
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title	Method and apparatus for revising wiring of a circuit to prevent electro-migration
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