Parameter variation probing technique

A technique for probing parameter variations in an integrated circuit chip includes providing a group of ring oscillators disposed over the integrated circuit chip, each oscillator producing an output representative of an integrated circuit chip parameter. A controller is provided to selectively ena...

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Bibliographische Detailangaben

1. Verfasser:	Samaan, Samie
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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