Method and apparatus for testing semiconductor devices using the back side of a circuit board

A test system for a semiconductor device couples the device to the back side of a circuit board, thereby allowing the device to be tested under actual operating conditions while providing adequate clearance around the device to accommodate automatic handling equipment, and also reducing signal delay...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Kim, Sun-Ju, Kim, Chang-Nyun, Kim, Jong-Hyun, Yoon, Chung-Koo, Park, Sang-Jun
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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