INTERFERENCE LAYER SYSTEM

A process is provided for sputter-induced precipitation of metal oxide layers on substrates by means of a reactive sputter process. The plasma charge acting upon the target to be evaporated is provided with electric power selected such that the metal oxide layers precipitated on the substrates to be...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SZCZYRBOWSKI, JOACHIM, BRAUER, GUNTER
Format: Patent
Sprache:eng
Online-Zugang:Volltext bestellen
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