Determination of optical constant of materials by two different methods: An application to single crystals Si

The normal reflectance of single crystal Si was measured at 0.5 5.6 eV range by unpolarized light. Optical parameters of Si were determined from this reflectance data by using two different methods: oscillator fit procedure and Kramers-Kronig analysis. The refractive index, extinction coefficient an...

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Veröffentlicht in:	Turkish journal of physics 2000, Vol.24 (6), p.725-735
Hauptverfasser:	DURMUŞ, Haziret, KARABIYIK, Haldun, ŞAFAK, Haluk
Format:	Artikel
Sprache:	eng
Schlagworte:	Deney Electricity, Magnetism and Optics Elektrik, Manyetizma ve Optik experiment Kramers-Kronig ilişkisi Kramers-Kronig relation optical constant Optical parameter Optik parametre Optik sabiti single crystal Structure of Condensed Matter and Radiation Physics Tek kristal Yoğunlaşmış Madde Yapısı ve Radyasyon Fiziği
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