A Novel Fiducial Point Extraction Algorithm to Detect C and D Points from the Acceleration Photoplethysmogram (CnD)
The extraction of relevant features from the photoplethysmography signal for estimating certain physiological parameters is a challenging task. Various feature extraction methods have been proposed in the literature. In this study, we present a novel fiducial point extraction algorithm to detect c a...
Gespeichert in:
Veröffentlicht in: | Electronics (Basel) 2023-03, Vol.12 (5), p.1174 |
---|---|
Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The extraction of relevant features from the photoplethysmography signal for estimating certain physiological parameters is a challenging task. Various feature extraction methods have been proposed in the literature. In this study, we present a novel fiducial point extraction algorithm to detect c and d points from the acceleration photoplethysmogram (APG), namely “CnD”. The algorithm allows for the application of various pre-processing techniques, such as filtering, smoothing, and removing baseline drift; the possibility of calculating first, second, and third photoplethysmography derivatives; and the implementation of algorithms for detecting and highlighting APG fiducial points. An evaluation of the CnD indicated a high level of accuracy in the algorithm’s ability to identify fiducial points. Out of 438 APG fiducial c and d points, the algorithm accurately identified 434 points, resulting in an accuracy rate of 99%. This level of accuracy was consistent across all the test cases, with low error rates. These findings indicate that the algorithm has a high potential for use in practical applications as a reliable method for detecting fiducial points. Thereby, it provides a valuable new resource for researchers and healthcare professionals working in the analysis of photoplethysmography signals. |
---|---|
ISSN: | 2079-9292 2079-9292 |
DOI: | 10.3390/electronics12051174 |