Probing the uniformity of silver-doped epitaxial graphene by micro-Raman mapping

We present a Raman spectroscopy study on epitaxial graphene decorated with thin Ag films (2–15 nm), which are deposited using magnetron sputtering. We find that the presence of Ag on the graphene surface induces doping, the uniformity and efficiency of which is determined by Ag nominal thickness. Deposition of Ag films with thicknesses up to 5 nm favors the effective electron transfer from Ag to epitaxial graphene. A significant redshift and broadening of the 2D peak are observed with increasing the Ag-layer thickness above 5 nm, which is indicative of large strain and doping fluctuations. We also observe a non-trivial linear growth of 2D/G peak intensity ratio with increasing D/G ratio for all Ag-decorated samples, which is explained by increase of peak amplitude due to surface enhanced Raman scattering and charged impurity-induced screening caused by the presence of Ag on the graphene surface.