Experimental reliability study of cumulative damage models on state-of-the-art semiconductor technologies for step-stress tests and mission profile stresses

Cumulative damage models are essential for reliability analysis, whether it is for the development of time-saving step-stress or ramp-stress life tests or for the qualification of products against mission-profile-based lifetime requirements. Although many cumulative damage models have been proposed...

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Veröffentlicht in:	Journal of vacuum science and technology. B, Nanotechnology & microelectronics Nanotechnology & microelectronics, 2020-11, Vol.38 (6)
Hauptverfasser:	Hirler, A., Biba, J., Lipp, D., Lochner, H., Siddabathula, M., Simon, S., Sulima, T., Wiatr, M., Hansch, W.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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