Detailed analysis of impact collision ion scattering spectroscopy of bismuth selenide
Impact collision ion scattering spectroscopy (ICISS), which is a variation of low energy ion scattering (LEIS) that employs large scattering angles, is performed on Bi2Se3 surfaces prepared by ion bombardment and annealing. ICISS angular scans are collected experimentally and simulated numerically a...
Gespeichert in:
| Veröffentlicht in: | Journal of vacuum science & technology. A, Vacuum, surfaces, and films Vacuum, surfaces, and films, 2017-05, Vol.35 (3) |
|---|---|
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | 3 |
| container_start_page | |
| container_title | Journal of vacuum science & technology. A, Vacuum, surfaces, and films |
| container_volume | 35 |
| creator | Zhou, Weimin Zhu, Haoshan Yarmoff, Jory A. |
| description | Impact collision ion
scattering spectroscopy (ICISS), which is a variation of low energy
ion scattering
(LEIS) that employs large scattering angles, is performed on
Bi2Se3 surfaces prepared by ion bombardment and annealing. ICISS
angular scans are collected experimentally and simulated numerically along the [120] and [
1
¯
2
¯
0] azimuths, and the match of the positions of the flux
peaks shows that the top three atomic layers are bulk-terminated. A newly observed feature
is identified as a minimum in the multiple scattering background when the ion beam incidence is along a
low index direction. Calculated scans as a function of scattering
angle are employed to identify the behavior of flux peaks to show whether they originate
from shadowing, blocking or both. This new method for analysis of large-angle LEIS
data is shown to be useful for accurately investigating complex surface structures. |
| doi_str_mv | 10.1116/1.4978253 |
| format | Article |
| fullrecord | <record><control><sourceid>scitation_cross</sourceid><recordid>TN_cdi_scitation_primary_10_1116_1_4978253</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>scitation_primary_10_1116_1_4978253</sourcerecordid><originalsourceid>FETCH-LOGICAL-c334t-51640ff8f50ce66fd1a28f81df3d3beddaa6702d1a200671857d73ae0abfc1f33</originalsourceid><addsrcrecordid>eNqdkEtLBDEQhIMoOK4e_Ae5KszanUwys0dZn7DgxT0P2Tw0Mi-mo7D_3hl2wbuHpqD5KKqKsWuEJSLqO1wWq7ISSp6wDJWAvFJqdcoyKGWRCwQ8ZxdEXwAgBOiMbR98MrHxjpvONHuKxPvAYzsYm7jtmyZS7Ds-H1mTkh9j98Fp8DaNPdl-2M_8LlL7nT45-cZ30flLdhZMQ_7qqAu2fXp8X7_km7fn1_X9JrdSFilXqAsIoQoKrNc6ODSiChW6IJ3ceeeM0SWI-Q2gS6xU6UppPJhdsBikXLCbg6-dwtDoQz2MsTXjvkao5z1qrI97TOztgSUbk0lTo__BP_34B9bDlPUX-gdwnw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Detailed analysis of impact collision ion scattering spectroscopy of bismuth selenide</title><source>AIP Journals Complete</source><source>Alma/SFX Local Collection</source><creator>Zhou, Weimin ; Zhu, Haoshan ; Yarmoff, Jory A.</creator><creatorcontrib>Zhou, Weimin ; Zhu, Haoshan ; Yarmoff, Jory A.</creatorcontrib><description>Impact collision ion
scattering spectroscopy (ICISS), which is a variation of low energy
ion scattering
(LEIS) that employs large scattering angles, is performed on
Bi2Se3 surfaces prepared by ion bombardment and annealing. ICISS
angular scans are collected experimentally and simulated numerically along the [120] and [
1
¯
2
¯
0] azimuths, and the match of the positions of the flux
peaks shows that the top three atomic layers are bulk-terminated. A newly observed feature
is identified as a minimum in the multiple scattering background when the ion beam incidence is along a
low index direction. Calculated scans as a function of scattering
angle are employed to identify the behavior of flux peaks to show whether they originate
from shadowing, blocking or both. This new method for analysis of large-angle LEIS
data is shown to be useful for accurately investigating complex surface structures.</description><identifier>ISSN: 0734-2101</identifier><identifier>EISSN: 1520-8559</identifier><identifier>DOI: 10.1116/1.4978253</identifier><identifier>CODEN: JVTAD6</identifier><language>eng</language><ispartof>Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2017-05, Vol.35 (3)</ispartof><rights>American Vacuum Society</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c334t-51640ff8f50ce66fd1a28f81df3d3beddaa6702d1a200671857d73ae0abfc1f33</citedby><cites>FETCH-LOGICAL-c334t-51640ff8f50ce66fd1a28f81df3d3beddaa6702d1a200671857d73ae0abfc1f33</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,790,4498,27901,27902</link.rule.ids></links><search><creatorcontrib>Zhou, Weimin</creatorcontrib><creatorcontrib>Zhu, Haoshan</creatorcontrib><creatorcontrib>Yarmoff, Jory A.</creatorcontrib><title>Detailed analysis of impact collision ion scattering spectroscopy of bismuth selenide</title><title>Journal of vacuum science & technology. A, Vacuum, surfaces, and films</title><description>Impact collision ion
scattering spectroscopy (ICISS), which is a variation of low energy
ion scattering
(LEIS) that employs large scattering angles, is performed on
Bi2Se3 surfaces prepared by ion bombardment and annealing. ICISS
angular scans are collected experimentally and simulated numerically along the [120] and [
1
¯
2
¯
0] azimuths, and the match of the positions of the flux
peaks shows that the top three atomic layers are bulk-terminated. A newly observed feature
is identified as a minimum in the multiple scattering background when the ion beam incidence is along a
low index direction. Calculated scans as a function of scattering
angle are employed to identify the behavior of flux peaks to show whether they originate
from shadowing, blocking or both. This new method for analysis of large-angle LEIS
data is shown to be useful for accurately investigating complex surface structures.</description><issn>0734-2101</issn><issn>1520-8559</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><recordid>eNqdkEtLBDEQhIMoOK4e_Ae5KszanUwys0dZn7DgxT0P2Tw0Mi-mo7D_3hl2wbuHpqD5KKqKsWuEJSLqO1wWq7ISSp6wDJWAvFJqdcoyKGWRCwQ8ZxdEXwAgBOiMbR98MrHxjpvONHuKxPvAYzsYm7jtmyZS7Ds-H1mTkh9j98Fp8DaNPdl-2M_8LlL7nT45-cZ30flLdhZMQ_7qqAu2fXp8X7_km7fn1_X9JrdSFilXqAsIoQoKrNc6ODSiChW6IJ3ceeeM0SWI-Q2gS6xU6UppPJhdsBikXLCbg6-dwtDoQz2MsTXjvkao5z1qrI97TOztgSUbk0lTo__BP_34B9bDlPUX-gdwnw</recordid><startdate>201705</startdate><enddate>201705</enddate><creator>Zhou, Weimin</creator><creator>Zhu, Haoshan</creator><creator>Yarmoff, Jory A.</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>201705</creationdate><title>Detailed analysis of impact collision ion scattering spectroscopy of bismuth selenide</title><author>Zhou, Weimin ; Zhu, Haoshan ; Yarmoff, Jory A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c334t-51640ff8f50ce66fd1a28f81df3d3beddaa6702d1a200671857d73ae0abfc1f33</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zhou, Weimin</creatorcontrib><creatorcontrib>Zhu, Haoshan</creatorcontrib><creatorcontrib>Yarmoff, Jory A.</creatorcontrib><collection>CrossRef</collection><jtitle>Journal of vacuum science & technology. A, Vacuum, surfaces, and films</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zhou, Weimin</au><au>Zhu, Haoshan</au><au>Yarmoff, Jory A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Detailed analysis of impact collision ion scattering spectroscopy of bismuth selenide</atitle><jtitle>Journal of vacuum science & technology. A, Vacuum, surfaces, and films</jtitle><date>2017-05</date><risdate>2017</risdate><volume>35</volume><issue>3</issue><issn>0734-2101</issn><eissn>1520-8559</eissn><coden>JVTAD6</coden><abstract>Impact collision ion
scattering spectroscopy (ICISS), which is a variation of low energy
ion scattering
(LEIS) that employs large scattering angles, is performed on
Bi2Se3 surfaces prepared by ion bombardment and annealing. ICISS
angular scans are collected experimentally and simulated numerically along the [120] and [
1
¯
2
¯
0] azimuths, and the match of the positions of the flux
peaks shows that the top three atomic layers are bulk-terminated. A newly observed feature
is identified as a minimum in the multiple scattering background when the ion beam incidence is along a
low index direction. Calculated scans as a function of scattering
angle are employed to identify the behavior of flux peaks to show whether they originate
from shadowing, blocking or both. This new method for analysis of large-angle LEIS
data is shown to be useful for accurately investigating complex surface structures.</abstract><doi>10.1116/1.4978253</doi><tpages>7</tpages><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0734-2101 |
| ispartof | Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2017-05, Vol.35 (3) |
| issn | 0734-2101 1520-8559 |
| language | eng |
| recordid | cdi_scitation_primary_10_1116_1_4978253 |
| source | AIP Journals Complete; Alma/SFX Local Collection |
| title | Detailed analysis of impact collision ion scattering spectroscopy of bismuth selenide |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-31T13%3A15%3A10IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-scitation_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Detailed%20analysis%20of%20impact%20collision%20ion%20scattering%20spectroscopy%20of%20bismuth%20selenide&rft.jtitle=Journal%20of%20vacuum%20science%20&%20technology.%20A,%20Vacuum,%20surfaces,%20and%20films&rft.au=Zhou,%20Weimin&rft.date=2017-05&rft.volume=35&rft.issue=3&rft.issn=0734-2101&rft.eissn=1520-8559&rft.coden=JVTAD6&rft_id=info:doi/10.1116/1.4978253&rft_dat=%3Cscitation_cross%3Escitation_primary_10_1116_1_4978253%3C/scitation_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |