Plasma-enhanced atomic layer deposition and etching of high-k gadolinium oxide

Atomic layer deposition (ALD) of high-quality gadolinium oxide thin films is achieved using Gd(iPrCp)3 and O2 plasma. Gd2O3 growth is observed from 150 to 350 °C, though the optical properties of the film improve at higher temperature. True layer-by-layer ALD growth of Gd2O3 occurred in a relatively...

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Veröffentlicht in:Journal of Vacuum Science and Technology. A, International Journal Devoted to Vacuum, Surfaces, and Films International Journal Devoted to Vacuum, Surfaces, and Films, 2012-01, Vol.30 (1), p.01A130-01A130-7
Hauptverfasser: Vitale, Steven A., Wyatt, Peter W., Hodson, Chris J.
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Sprache:eng
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