Resonant soft x-ray reflectivity of organic thin films

At photon energies close to absorption edges in the soft x-ray range, the complex index of refraction, n = 1 − δ − i β , of organic materials varies rapidly as a function of photon energy in a manner that strongly depends on the chemical moieties and functionalities present in the material. The auth...

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Veröffentlicht in:	Journal of Vacuum Science and Technology. A, International Journal Devoted to Vacuum, Surfaces, and Films International Journal Devoted to Vacuum, Surfaces, and Films, 2007-05, Vol.25 (3), p.575-586
Hauptverfasser:	Wang, Cheng, Araki, Tohru, Watts, Benjamin, Harton, Shane, Koga, Tadanori, Basu, Saibal, Ade, Harald
Format:	Artikel
Sprache:	eng
Schlagworte:	COMPARATIVE EVALUATIONS CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY DEUTERIUM LAYERS METHACRYLIC ACID ESTERS MOLECULAR STRUCTURE NEUTRON BEAMS NEUTRONS ORGANIC MATTER PHOTONS POLYSTYRENE REFLECTIVITY REFRACTIVE INDEX SOFT X RADIATION THIN FILMS
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