Selective water vapor cryopumping through argon

A selective cryopumping process for water vapor control takes place in vacuum systems for web coating or plasma operations, such as sputter deposition, etching, etc. Excessive water vapor content will affect the quality of the processes and final products. These vacuum systems typically operate at p...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of vacuum science & technology. A, Vacuum, surfaces, and films Vacuum, surfaces, and films, 2006-07, Vol.24 (4), p.1592-1596
Hauptverfasser: Kryukov, A. P., Podcherniaev, O., Hall, P. H., Plumley, D. J., Levashov, V. Yu, Shishkova, I. N.
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 1596
container_issue 4
container_start_page 1592
container_title Journal of vacuum science & technology. A, Vacuum, surfaces, and films
container_volume 24
creator Kryukov, A. P.
Podcherniaev, O.
Hall, P. H.
Plumley, D. J.
Levashov, V. Yu
Shishkova, I. N.
description A selective cryopumping process for water vapor control takes place in vacuum systems for web coating or plasma operations, such as sputter deposition, etching, etc. Excessive water vapor content will affect the quality of the processes and final products. These vacuum systems typically operate at pressures corresponding to transitional or viscous flow regimes, and water vapor cryopumping is highly limited by diffusion of water vapor molecules through a noncondensable process gas (argon, air). An analytical model was created to describe water vapor condensing process through a noncondensable gas diffusion barrier. The model accounts for the collisions of different molecules by means of Boltzmann kinetic equations for two-component rarefied gas. It was assumed that water vapor content is about three orders of magnitude lower than that of the noncondensable gas (argon). Cryopumping process was analyzed for two simplified cases when water vapor source and cryosurface are parallel plates and coaxial cylinders. The calculations were conducted for different water vapor outgassing rates and argon pressures ranging from 0.5 × 10 − 3 to 20.0 × 10 − 3 torr . At certain parameters a strongly nonlinear distribution of water vapor pressure and density versus distance between source and cryosurface was obtained. At high argon pressures an increase of water vapor pressure was observed near an outgassing surface. The results were used for calculation of water vapor cryopumping rates.
doi_str_mv 10.1116/1.2194928
format Article
fullrecord <record><control><sourceid>scitation_cross</sourceid><recordid>TN_cdi_scitation_primary_10_1116_1_2194928</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>scitation_primary_10_1116_1_2194928Selective_water_vapo</sourcerecordid><originalsourceid>FETCH-LOGICAL-c354t-3d01005baad73fb29c4e4856313dd315a6d967b52723509245ede33e37231c8d3</originalsourceid><addsrcrecordid>eNqNj0tLw0AURgdRMFYX_oNsFdLeOzeTx0aQ4gsKLtT1MJmZpJE2EyZppP_e1BZdKa4-PjgcOIxdIkwRMZnhlGMe5zw7YgEKDlEmRH7MAkgpjjgCnrKzrnsHAM4hCdjsxa6s7uvBhh-qtz4cVOt8qP3WtZt1WzdV2C-921TLUPnKNefspFSrzl4cdsLe7u9e54_R4vnhaX67iDSJuI_IAAKIQimTUlnwXMc2zkRCSMYQCpWYPEkLwVNOAnIeC2sskaXxo84MTdjV3qu96zpvS9n6eq38ViLIXalEeSgd2Zs92-m6V33tmt_h71z5lSt3uaPg-t-Cv-DB-R9QtqakTxX8dn8</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Selective water vapor cryopumping through argon</title><source>AIP Journals Complete</source><creator>Kryukov, A. P. ; Podcherniaev, O. ; Hall, P. H. ; Plumley, D. J. ; Levashov, V. Yu ; Shishkova, I. N.</creator><creatorcontrib>Kryukov, A. P. ; Podcherniaev, O. ; Hall, P. H. ; Plumley, D. J. ; Levashov, V. Yu ; Shishkova, I. N.</creatorcontrib><description>A selective cryopumping process for water vapor control takes place in vacuum systems for web coating or plasma operations, such as sputter deposition, etching, etc. Excessive water vapor content will affect the quality of the processes and final products. These vacuum systems typically operate at pressures corresponding to transitional or viscous flow regimes, and water vapor cryopumping is highly limited by diffusion of water vapor molecules through a noncondensable process gas (argon, air). An analytical model was created to describe water vapor condensing process through a noncondensable gas diffusion barrier. The model accounts for the collisions of different molecules by means of Boltzmann kinetic equations for two-component rarefied gas. It was assumed that water vapor content is about three orders of magnitude lower than that of the noncondensable gas (argon). Cryopumping process was analyzed for two simplified cases when water vapor source and cryosurface are parallel plates and coaxial cylinders. The calculations were conducted for different water vapor outgassing rates and argon pressures ranging from 0.5 × 10 − 3 to 20.0 × 10 − 3 torr . At certain parameters a strongly nonlinear distribution of water vapor pressure and density versus distance between source and cryosurface was obtained. At high argon pressures an increase of water vapor pressure was observed near an outgassing surface. The results were used for calculation of water vapor cryopumping rates.</description><identifier>ISSN: 0734-2101</identifier><identifier>EISSN: 1520-8559</identifier><identifier>DOI: 10.1116/1.2194928</identifier><identifier>CODEN: JVTAD6</identifier><language>eng</language><publisher>American Vacuum Society</publisher><ispartof>Journal of vacuum science &amp; technology. A, Vacuum, surfaces, and films, 2006-07, Vol.24 (4), p.1592-1596</ispartof><rights>American Vacuum Society</rights><rights>2006 American Vacuum Society</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c354t-3d01005baad73fb29c4e4856313dd315a6d967b52723509245ede33e37231c8d3</citedby><cites>FETCH-LOGICAL-c354t-3d01005baad73fb29c4e4856313dd315a6d967b52723509245ede33e37231c8d3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,790,4498,27901,27902</link.rule.ids></links><search><creatorcontrib>Kryukov, A. P.</creatorcontrib><creatorcontrib>Podcherniaev, O.</creatorcontrib><creatorcontrib>Hall, P. H.</creatorcontrib><creatorcontrib>Plumley, D. J.</creatorcontrib><creatorcontrib>Levashov, V. Yu</creatorcontrib><creatorcontrib>Shishkova, I. N.</creatorcontrib><title>Selective water vapor cryopumping through argon</title><title>Journal of vacuum science &amp; technology. A, Vacuum, surfaces, and films</title><description>A selective cryopumping process for water vapor control takes place in vacuum systems for web coating or plasma operations, such as sputter deposition, etching, etc. Excessive water vapor content will affect the quality of the processes and final products. These vacuum systems typically operate at pressures corresponding to transitional or viscous flow regimes, and water vapor cryopumping is highly limited by diffusion of water vapor molecules through a noncondensable process gas (argon, air). An analytical model was created to describe water vapor condensing process through a noncondensable gas diffusion barrier. The model accounts for the collisions of different molecules by means of Boltzmann kinetic equations for two-component rarefied gas. It was assumed that water vapor content is about three orders of magnitude lower than that of the noncondensable gas (argon). Cryopumping process was analyzed for two simplified cases when water vapor source and cryosurface are parallel plates and coaxial cylinders. The calculations were conducted for different water vapor outgassing rates and argon pressures ranging from 0.5 × 10 − 3 to 20.0 × 10 − 3 torr . At certain parameters a strongly nonlinear distribution of water vapor pressure and density versus distance between source and cryosurface was obtained. At high argon pressures an increase of water vapor pressure was observed near an outgassing surface. The results were used for calculation of water vapor cryopumping rates.</description><issn>0734-2101</issn><issn>1520-8559</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><recordid>eNqNj0tLw0AURgdRMFYX_oNsFdLeOzeTx0aQ4gsKLtT1MJmZpJE2EyZppP_e1BZdKa4-PjgcOIxdIkwRMZnhlGMe5zw7YgEKDlEmRH7MAkgpjjgCnrKzrnsHAM4hCdjsxa6s7uvBhh-qtz4cVOt8qP3WtZt1WzdV2C-921TLUPnKNefspFSrzl4cdsLe7u9e54_R4vnhaX67iDSJuI_IAAKIQimTUlnwXMc2zkRCSMYQCpWYPEkLwVNOAnIeC2sskaXxo84MTdjV3qu96zpvS9n6eq38ViLIXalEeSgd2Zs92-m6V33tmt_h71z5lSt3uaPg-t-Cv-DB-R9QtqakTxX8dn8</recordid><startdate>20060701</startdate><enddate>20060701</enddate><creator>Kryukov, A. P.</creator><creator>Podcherniaev, O.</creator><creator>Hall, P. H.</creator><creator>Plumley, D. J.</creator><creator>Levashov, V. Yu</creator><creator>Shishkova, I. N.</creator><general>American Vacuum Society</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20060701</creationdate><title>Selective water vapor cryopumping through argon</title><author>Kryukov, A. P. ; Podcherniaev, O. ; Hall, P. H. ; Plumley, D. J. ; Levashov, V. Yu ; Shishkova, I. N.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c354t-3d01005baad73fb29c4e4856313dd315a6d967b52723509245ede33e37231c8d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2006</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kryukov, A. P.</creatorcontrib><creatorcontrib>Podcherniaev, O.</creatorcontrib><creatorcontrib>Hall, P. H.</creatorcontrib><creatorcontrib>Plumley, D. J.</creatorcontrib><creatorcontrib>Levashov, V. Yu</creatorcontrib><creatorcontrib>Shishkova, I. N.</creatorcontrib><collection>CrossRef</collection><jtitle>Journal of vacuum science &amp; technology. A, Vacuum, surfaces, and films</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kryukov, A. P.</au><au>Podcherniaev, O.</au><au>Hall, P. H.</au><au>Plumley, D. J.</au><au>Levashov, V. Yu</au><au>Shishkova, I. N.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Selective water vapor cryopumping through argon</atitle><jtitle>Journal of vacuum science &amp; technology. A, Vacuum, surfaces, and films</jtitle><date>2006-07-01</date><risdate>2006</risdate><volume>24</volume><issue>4</issue><spage>1592</spage><epage>1596</epage><pages>1592-1596</pages><issn>0734-2101</issn><eissn>1520-8559</eissn><coden>JVTAD6</coden><abstract>A selective cryopumping process for water vapor control takes place in vacuum systems for web coating or plasma operations, such as sputter deposition, etching, etc. Excessive water vapor content will affect the quality of the processes and final products. These vacuum systems typically operate at pressures corresponding to transitional or viscous flow regimes, and water vapor cryopumping is highly limited by diffusion of water vapor molecules through a noncondensable process gas (argon, air). An analytical model was created to describe water vapor condensing process through a noncondensable gas diffusion barrier. The model accounts for the collisions of different molecules by means of Boltzmann kinetic equations for two-component rarefied gas. It was assumed that water vapor content is about three orders of magnitude lower than that of the noncondensable gas (argon). Cryopumping process was analyzed for two simplified cases when water vapor source and cryosurface are parallel plates and coaxial cylinders. The calculations were conducted for different water vapor outgassing rates and argon pressures ranging from 0.5 × 10 − 3 to 20.0 × 10 − 3 torr . At certain parameters a strongly nonlinear distribution of water vapor pressure and density versus distance between source and cryosurface was obtained. At high argon pressures an increase of water vapor pressure was observed near an outgassing surface. The results were used for calculation of water vapor cryopumping rates.</abstract><pub>American Vacuum Society</pub><doi>10.1116/1.2194928</doi><tpages>5</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0734-2101
ispartof Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2006-07, Vol.24 (4), p.1592-1596
issn 0734-2101
1520-8559
language eng
recordid cdi_scitation_primary_10_1116_1_2194928
source AIP Journals Complete
title Selective water vapor cryopumping through argon
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-09T05%3A59%3A29IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-scitation_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Selective%20water%20vapor%20cryopumping%20through%20argon&rft.jtitle=Journal%20of%20vacuum%20science%20&%20technology.%20A,%20Vacuum,%20surfaces,%20and%20films&rft.au=Kryukov,%20A.%20P.&rft.date=2006-07-01&rft.volume=24&rft.issue=4&rft.spage=1592&rft.epage=1596&rft.pages=1592-1596&rft.issn=0734-2101&rft.eissn=1520-8559&rft.coden=JVTAD6&rft_id=info:doi/10.1116/1.2194928&rft_dat=%3Cscitation_cross%3Escitation_primary_10_1116_1_2194928Selective_water_vapo%3C/scitation_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true