X-ray photoelectron spectroscopy study of electrodeposited nanostructured CeO 2 films
Nanostructured CeO 2 films are produced by anodic electrodeposition onto a variety of substrates. The crystal structure and oxidation state of the films are studied by x-ray diffraction (XRD) and x-ray photoelectron spectroscopy (XPS), respectively. Calculations from XRD show that crystallite sizes...
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| Veröffentlicht in: | Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 2003-05, Vol.21 (3), p.1169-1175 |
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| Sprache: | eng |
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| container_issue | 3 |
| container_start_page | 1169 |
| container_title | Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures |
| container_volume | 21 |
| creator | Wang, Adele Qi Punchaipetch, Prakaipetch Wallace, Robert M. Golden, Teresa Diane |
| description | Nanostructured
CeO
2
films are produced by anodic electrodeposition onto a variety of substrates. The crystal structure and oxidation state of the films are studied by x-ray diffraction (XRD) and x-ray photoelectron spectroscopy (XPS), respectively. Calculations from XRD show that crystallite sizes of the electrodeposited films range from 6–10 nm. Sintering of these films to 700 °C increases the grain size to approximately 25 nm. A study of
Ce
3d,
Ce
4d,
O
1s,
and the valence-band region indicates that the Ce(IV)/Ce(III) ratio increases with sintering temperature, with features of both
Ce
4+
and
Ce
3+
identified by XPS.
Ce
3d
and
O
1s
characteristics show that high-temperature sintering of the films facilitates Ce(IV) oxide formation. |
| doi_str_mv | 10.1116/1.1577569 |
| format | Article |
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CeO
2
films are produced by anodic electrodeposition onto a variety of substrates. The crystal structure and oxidation state of the films are studied by x-ray diffraction (XRD) and x-ray photoelectron spectroscopy (XPS), respectively. Calculations from XRD show that crystallite sizes of the electrodeposited films range from 6–10 nm. Sintering of these films to 700 °C increases the grain size to approximately 25 nm. A study of
Ce
3d,
Ce
4d,
O
1s,
and the valence-band region indicates that the Ce(IV)/Ce(III) ratio increases with sintering temperature, with features of both
Ce
4+
and
Ce
3+
identified by XPS.
Ce
3d
and
O
1s
characteristics show that high-temperature sintering of the films facilitates Ce(IV) oxide formation.</description><identifier>ISSN: 0734-211X</identifier><identifier>EISSN: 1520-8567</identifier><identifier>DOI: 10.1116/1.1577569</identifier><identifier>CODEN: JVTBD9</identifier><language>eng</language><ispartof>Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2003-05, Vol.21 (3), p.1169-1175</ispartof><rights>American Vacuum Society</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,794,4512,27924,27925</link.rule.ids></links><search><creatorcontrib>Wang, Adele Qi</creatorcontrib><creatorcontrib>Punchaipetch, Prakaipetch</creatorcontrib><creatorcontrib>Wallace, Robert M.</creatorcontrib><creatorcontrib>Golden, Teresa Diane</creatorcontrib><title>X-ray photoelectron spectroscopy study of electrodeposited nanostructured CeO 2 films</title><title>Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures</title><description>Nanostructured
CeO
2
films are produced by anodic electrodeposition onto a variety of substrates. The crystal structure and oxidation state of the films are studied by x-ray diffraction (XRD) and x-ray photoelectron spectroscopy (XPS), respectively. Calculations from XRD show that crystallite sizes of the electrodeposited films range from 6–10 nm. Sintering of these films to 700 °C increases the grain size to approximately 25 nm. A study of
Ce
3d,
Ce
4d,
O
1s,
and the valence-band region indicates that the Ce(IV)/Ce(III) ratio increases with sintering temperature, with features of both
Ce
4+
and
Ce
3+
identified by XPS.
Ce
3d
and
O
1s
characteristics show that high-temperature sintering of the films facilitates Ce(IV) oxide formation.</description><issn>0734-211X</issn><issn>1520-8567</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><sourceid/><recordid>eNqtjs2KwjAUhYMoWH8WvkHWA9Xc1rSdtYy4c6PgLoQ2xUjbG3JToW8_M1LwBVydczjf4mNsA2ILANkOtiDzXGbfExaBTERcyCyfskjk6T5OAG5ztiB6CAFQyDRi11vs9cDdHQOaxpTBY8fJvQqV6AZOoa8GjjUf78o4JBtMxTvdIQXfl6H3f_NgzjzhtW1aWrFZrRsy6zGX7Ov4czmcYipt0MFip5y3rfaDAqH-xRWoUTz9FPxE_waVq-r0F9SPWSQ</recordid><startdate>200305</startdate><enddate>200305</enddate><creator>Wang, Adele Qi</creator><creator>Punchaipetch, Prakaipetch</creator><creator>Wallace, Robert M.</creator><creator>Golden, Teresa Diane</creator><scope/></search><sort><creationdate>200305</creationdate><title>X-ray photoelectron spectroscopy study of electrodeposited nanostructured CeO 2 films</title><author>Wang, Adele Qi ; Punchaipetch, Prakaipetch ; Wallace, Robert M. ; Golden, Teresa Diane</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-scitation_primary_10_1116_1_15775693</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2003</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Wang, Adele Qi</creatorcontrib><creatorcontrib>Punchaipetch, Prakaipetch</creatorcontrib><creatorcontrib>Wallace, Robert M.</creatorcontrib><creatorcontrib>Golden, Teresa Diane</creatorcontrib><jtitle>Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wang, Adele Qi</au><au>Punchaipetch, Prakaipetch</au><au>Wallace, Robert M.</au><au>Golden, Teresa Diane</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>X-ray photoelectron spectroscopy study of electrodeposited nanostructured CeO 2 films</atitle><jtitle>Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures</jtitle><date>2003-05</date><risdate>2003</risdate><volume>21</volume><issue>3</issue><spage>1169</spage><epage>1175</epage><pages>1169-1175</pages><issn>0734-211X</issn><eissn>1520-8567</eissn><coden>JVTBD9</coden><abstract>Nanostructured
CeO
2
films are produced by anodic electrodeposition onto a variety of substrates. The crystal structure and oxidation state of the films are studied by x-ray diffraction (XRD) and x-ray photoelectron spectroscopy (XPS), respectively. Calculations from XRD show that crystallite sizes of the electrodeposited films range from 6–10 nm. Sintering of these films to 700 °C increases the grain size to approximately 25 nm. A study of
Ce
3d,
Ce
4d,
O
1s,
and the valence-band region indicates that the Ce(IV)/Ce(III) ratio increases with sintering temperature, with features of both
Ce
4+
and
Ce
3+
identified by XPS.
Ce
3d
and
O
1s
characteristics show that high-temperature sintering of the films facilitates Ce(IV) oxide formation.</abstract><doi>10.1116/1.1577569</doi><tpages>7</tpages></addata></record> |
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| ispartof | Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2003-05, Vol.21 (3), p.1169-1175 |
| issn | 0734-211X 1520-8567 |
| language | eng |
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| source | AIP Journals Complete |
| title | X-ray photoelectron spectroscopy study of electrodeposited nanostructured CeO 2 films |
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